Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

J. Chalupský; L. Juha; V. Hájková; J. Cihelka; L. Vyšín; J. Gautier; J. Hajdu; S. P. Hau-Riege; M. Jurek; J. Krzywinski; R. A. London; E. Papalazarou; J. B. Pelka; G. Rey; S. Sebban; R. Sobierajski; N. Stojanovic; K. Tiedtke; S. Toleikis; T. Tschentscher; C. Valentin; H. Wabnitz; P. Zeitoun

doi:10.1117/12.822297

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

J. Chalupský
, L. Juha
, V. Hájková
, J. Cihelka
, L. Vyšín
, J. Gautier
, J. Hajdu
, S. P. Hau-Riege
, M. Jurek
, J. Krzywinski
, R. A. London
, E. Papalazarou
, J. B. Pelka
, G. Rey
, S. Sebban
, R. Sobierajski
, N. Stojanovic
, K. Tiedtke
, S. Toleikis
, T. Tschentscher

C. Valentin, H. Wabnitz, P. Zeitoun

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Ultra-fast soft x-ray lasers have opened a new area of laser-matter interactions which in most cases differ from the well understood interaction of UV-vis radiation with solid targets. The photon energy >30eV essentially exceeds the width of band gap in any known material and excites the electrons from the deep atomic and valence levels directly to the conduction band. Both thermal and non-thermal phenomena can occur in such a material being caused by electron thermalization and bond breaking, respectively. We report the first observation of non-thermal single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by an atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze singleshot imprints in PMMA. An intermediate regime of materials removal has been found, confirming the model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm as a proof of an efficient material removal in the desorption regime.

Original language	English
Title of host publication	Damage to VUV, EUV, and X-Ray Optics II
DOIs	https://doi.org/10.1117/12.822297
Publication status	Published - 14 Sept 2009
Event	Damage to VUV, EUV, and X-Ray Optics II - Prague, Czech Republic Duration: 21 Apr 2009 → 23 Apr 2009

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7361
ISSN (Print)	0277-786X

Conference

Conference	Damage to VUV, EUV, and X-Ray Optics II
Country/Territory	Czech Republic
City	Prague
Period	21/04/09 → 23/04/09

Keywords

Ablation
Desorption
Laser beam profile
Poly(methyl methacrylate)-PMMA
Soft X-ray laser

Access to Document

10.1117/12.822297

Cite this

Chalupský, J., Juha, L., Hájková, V., Cihelka, J., Vyšín, L., Gautier, J., Hajdu, J., Hau-Riege, S. P., Jurek, M., Krzywinski, J., London, R. A., Papalazarou, E., Pelka, J. B., Rey, G., Sebban, S., Sobierajski, R., Stojanovic, N., Tiedtke, K., Toleikis, S., ... Zeitoun, P. (2009). Response of molecular solids to ultra-intense femtosecond soft x-ray pulses. In Damage to VUV, EUV, and X-Ray Optics II Article 736108 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7361). https://doi.org/10.1117/12.822297

@inproceedings{61666e480ae3403387d8ae500ef810d2,

title = "Response of molecular solids to ultra-intense femtosecond soft x-ray pulses",

abstract = "Ultra-fast soft x-ray lasers have opened a new area of laser-matter interactions which in most cases differ from the well understood interaction of UV-vis radiation with solid targets. The photon energy >30eV essentially exceeds the width of band gap in any known material and excites the electrons from the deep atomic and valence levels directly to the conduction band. Both thermal and non-thermal phenomena can occur in such a material being caused by electron thermalization and bond breaking, respectively. We report the first observation of non-thermal single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by an atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze singleshot imprints in PMMA. An intermediate regime of materials removal has been found, confirming the model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm as a proof of an efficient material removal in the desorption regime.",

keywords = "Ablation, Desorption, Laser beam profile, Poly(methyl methacrylate)-PMMA, Soft X-ray laser",

author = "J. Chalupsk{\'y} and L. Juha and V. H{\'a}jkov{\'a} and J. Cihelka and L. Vy{\v s}{\'i}n and J. Gautier and J. Hajdu and Hau-Riege, \{S. P.\} and M. Jurek and J. Krzywinski and London, \{R. A.\} and E. Papalazarou and Pelka, \{J. B.\} and G. Rey and S. Sebban and R. Sobierajski and N. Stojanovic and K. Tiedtke and S. Toleikis and T. Tschentscher and C. Valentin and H. Wabnitz and P. Zeitoun",

year = "2009",

month = sep,

day = "14",

doi = "10.1117/12.822297",

language = "English",

isbn = "9780819476357",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Damage to VUV, EUV, and X-Ray Optics II",

note = "Damage to VUV, EUV, and X-Ray Optics II ; Conference date: 21-04-2009 Through 23-04-2009",

}

Chalupský, J, Juha, L, Hájková, V, Cihelka, J, Vyšín, L, Gautier, J, Hajdu, J, Hau-Riege, SP, Jurek, M, Krzywinski, J, London, RA, Papalazarou, E, Pelka, JB, Rey, G, Sebban, S, Sobierajski, R, Stojanovic, N, Tiedtke, K, Toleikis, S, Tschentscher, T, Valentin, C, Wabnitz, H & Zeitoun, P 2009, Response of molecular solids to ultra-intense femtosecond soft x-ray pulses. in Damage to VUV, EUV, and X-Ray Optics II., 736108, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7361, Damage to VUV, EUV, and X-Ray Optics II, Prague, Czech Republic, 21/04/09. https://doi.org/10.1117/12.822297

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses. / Chalupský, J.; Juha, L.; Hájková, V. et al.
Damage to VUV, EUV, and X-Ray Optics II. 2009. 736108 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7361).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

AU - Chalupský, J.

AU - Juha, L.

AU - Hájková, V.

AU - Cihelka, J.

AU - Vyšín, L.

AU - Gautier, J.

AU - Hajdu, J.

AU - Hau-Riege, S. P.

AU - Jurek, M.

AU - Krzywinski, J.

AU - London, R. A.

AU - Papalazarou, E.

AU - Pelka, J. B.

AU - Rey, G.

AU - Sebban, S.

AU - Sobierajski, R.

AU - Stojanovic, N.

AU - Tiedtke, K.

AU - Toleikis, S.

AU - Tschentscher, T.

AU - Valentin, C.

AU - Wabnitz, H.

AU - Zeitoun, P.

PY - 2009/9/14

Y1 - 2009/9/14

N2 - Ultra-fast soft x-ray lasers have opened a new area of laser-matter interactions which in most cases differ from the well understood interaction of UV-vis radiation with solid targets. The photon energy >30eV essentially exceeds the width of band gap in any known material and excites the electrons from the deep atomic and valence levels directly to the conduction band. Both thermal and non-thermal phenomena can occur in such a material being caused by electron thermalization and bond breaking, respectively. We report the first observation of non-thermal single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by an atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze singleshot imprints in PMMA. An intermediate regime of materials removal has been found, confirming the model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm as a proof of an efficient material removal in the desorption regime.

AB - Ultra-fast soft x-ray lasers have opened a new area of laser-matter interactions which in most cases differ from the well understood interaction of UV-vis radiation with solid targets. The photon energy >30eV essentially exceeds the width of band gap in any known material and excites the electrons from the deep atomic and valence levels directly to the conduction band. Both thermal and non-thermal phenomena can occur in such a material being caused by electron thermalization and bond breaking, respectively. We report the first observation of non-thermal single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by an atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze singleshot imprints in PMMA. An intermediate regime of materials removal has been found, confirming the model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm as a proof of an efficient material removal in the desorption regime.

KW - Ablation

KW - Desorption

KW - Laser beam profile

KW - Poly(methyl methacrylate)-PMMA

KW - Soft X-ray laser

U2 - 10.1117/12.822297

DO - 10.1117/12.822297

M3 - Conference contribution

AN - SCOPUS:69949189565

SN - 9780819476357

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Damage to VUV, EUV, and X-Ray Optics II

T2 - Damage to VUV, EUV, and X-Ray Optics II

Y2 - 21 April 2009 through 23 April 2009

ER -

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

Abstract

Publication series

Conference

Keywords

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