Abstract
This paper presents a novel approach for RF power measurements using a silicon MOSFET. It describes linear and nonlinear models of the RF MOSFET for results prediction. It shows a thorough comparison between predicted and measured results. The detector demonstrates a better sensitivity than biased Schottky diode detectors that we have measured.
| Original language | English |
|---|---|
| Pages (from-to) | 1139-1142 |
| Number of pages | 4 |
| Journal | IEEE MTT-S International Microwave Symposium Digest |
| Volume | 2 |
| Publication status | Published - 1 Jan 1998 |
| Event | Proceedings of the 1998 IEEE MTT-S International Microwave Symposium. Part 1 (of 3) - Baltimore, MD, USA Duration: 7 Jun 1998 → 12 Jun 1998 |
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