Scanning tunneling microscopy study of single-ion impacts on graphite surface

L. Porte; M. Phaner; C. H. de Villeneuve; N. Moncoffre; J. Tousset

doi:10.1016/0168-583X(89)90696-4

Scanning tunneling microscopy study of single-ion impacts on graphite surface

L. Porte
, M. Phaner
, C. H. de Villeneuve
, N. Moncoffre
, J. Tousset

Research output: Contribution to journal › Letter › peer-review

Abstract

Cleaved surfaces of highly oriented pyrolitic graphite were implanted with 50 keV-Ar⁺ and 150 keV-Xe³⁺ ions at a dose of S × 10¹¹ cm^-2. The surface damages due to single ion impacts were examined by scanning tunneling microscopy. Ion impacts are revealed by the formation of hillocks on the graphite surface. They are attributed to residual damages and defect-induced stresses due to the cascade collision of implanted ions.

Original language	English
Pages (from-to)	116-119
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	44
Issue number	1
DOIs	https://doi.org/10.1016/0168-583X(89)90696-4
Publication status	Published - 1 Jan 1989
Externally published	Yes

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title = "Scanning tunneling microscopy study of single-ion impacts on graphite surface",

abstract = "Cleaved surfaces of highly oriented pyrolitic graphite were implanted with 50 keV-Ar+ and 150 keV-Xe3+ ions at a dose of S × 1011 cm-2. The surface damages due to single ion impacts were examined by scanning tunneling microscopy. Ion impacts are revealed by the formation of hillocks on the graphite surface. They are attributed to residual damages and defect-induced stresses due to the cascade collision of implanted ions.",

author = "L. Porte and M. Phaner and \{de Villeneuve\}, \{C. H.\} and N. Moncoffre and J. Tousset",

year = "1989",

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doi = "10.1016/0168-583X(89)90696-4",

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T1 - Scanning tunneling microscopy study of single-ion impacts on graphite surface

AU - Porte, L.

AU - Phaner, M.

AU - de Villeneuve, C. H.

AU - Moncoffre, N.

AU - Tousset, J.

PY - 1989/1/1

Y1 - 1989/1/1

N2 - Cleaved surfaces of highly oriented pyrolitic graphite were implanted with 50 keV-Ar+ and 150 keV-Xe3+ ions at a dose of S × 1011 cm-2. The surface damages due to single ion impacts were examined by scanning tunneling microscopy. Ion impacts are revealed by the formation of hillocks on the graphite surface. They are attributed to residual damages and defect-induced stresses due to the cascade collision of implanted ions.

AB - Cleaved surfaces of highly oriented pyrolitic graphite were implanted with 50 keV-Ar+ and 150 keV-Xe3+ ions at a dose of S × 1011 cm-2. The surface damages due to single ion impacts were examined by scanning tunneling microscopy. Ion impacts are revealed by the formation of hillocks on the graphite surface. They are attributed to residual damages and defect-induced stresses due to the cascade collision of implanted ions.

U2 - 10.1016/0168-583X(89)90696-4

DO - 10.1016/0168-583X(89)90696-4

M3 - Letter

AN - SCOPUS:0024766062

SN - 0168-583X

VL - 44

SP - 116

EP - 119

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1

ER -

Scanning tunneling microscopy study of single-ion impacts on graphite surface

Abstract

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