@inproceedings{eb57513de8bb4b02859925a350ab96a0,
title = "Scintillator-based ion beam profiler for diagnosing laser-accelerated ion beams",
abstract = "Next generation intense, short-pulse laser facilities require new high repetition rate diagnostics for the detection of ionizing radiation. We have designed a new scintillator-based ion beam profiler capable of measuring the ion beam transverse profile for a number of discrete energy ranges. The optical response and emission characteristics of four common plastic scintillators has been investigated for a range of proton energies and fluxes. The scintillator light output (for 1 MeV > Ep < 28 MeV) was found to have a non-linear scaling with proton energy but a linear response to incident flux. Initial measurements with a prototype diagnostic have been successful, although further calibration work is required to characterize the total system response and limitations under the high flux, short pulse duration conditions of a typical high intensity laser-plasma interaction.",
keywords = "Acceleration, Ion, Laser, Plasma, Proton, Scintillator",
author = "Green, \{J. S.\} and M. Borghesi and Brenner, \{C. M.\} and Carroll, \{D. C.\} and Dover, \{N. P.\} and Foster, \{P. S.\} and P. Gallegos and S. Green and D. Kirby and Kirkby, \{K. J.\} and P. McKenna and Merchant, \{M. J.\} and Z. Najmudin and Palmer, \{C. A.J.\} and D. Parker and R. Prasad and Quinn, \{K. E.\} and Rajeev, \{P. P.\} and Read, \{M. P.\} and L. Romagnani and J. Schreiber and Streeter, \{M. J.V.\} and O. Tresca and Wahlstr{\"o}m, \{C. G.\} and M. Zepf and D. Neely",
year = "2011",
month = jul,
day = "13",
doi = "10.1117/12.888967",
language = "English",
isbn = "9780819486691",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Laser Acceleration of Electrons, Protons, and Ions; and Medical Applications of Laser-Generated Secondary Sources of Radiation and Particles",
note = "Laser Acceleration of Electrons, Protons, and Ions; and Medical Applications of Laser-Generated Secondary Sources of Radiation and Particles ; Conference date: 18-04-2011 Through 20-04-2011",
}