TY - GEN
T1 - Selenium chemistry modifications of Cu(In,Ga)Se2 surfaces after bromine etch. High resolution XPS studies of buried interface with chemically deposited CdS
AU - Canava, B.
AU - Guillemoles, J. F.
AU - Vigneron, J.
AU - Lincot, D.
AU - Etcheberry, A.
PY - 2006/7/20
Y1 - 2006/7/20
N2 - The formation of the interface Cu(In,Ga)Se2 (CIGS)/CdS in solar cells is not yet well fully understood but found crucial in fixing the final device quality. This interface depends on various parameters such as the initial chemical state of the CIGS surface or the chemical bath deposition (CBD) conditions used to grow the CdS layer. In this paper, XPS studies of buried interfaces were carried out by using gradual sputter etch. We have investigated interfaces on CIGS submitted or not to an aqueous bromine solution treatment. This chemical treatment leads to the formation of a Se° film on the CIGS surface, leaving a specular surface, which can be removed by a KCN treatment. The Se3d core level, which is probably the most interesting probe to provide a fine XPS characterization of the CIGS surface, was used to follow a chemical reactivity of interface during CdS growth. In this work, we present a detailed study of the evolution of the Se signal at CIGS surface and across the CIGS/CdS interfaces.We discuss problems of nucleation and growth of CdS layer on well defined CIGS surfaces.
AB - The formation of the interface Cu(In,Ga)Se2 (CIGS)/CdS in solar cells is not yet well fully understood but found crucial in fixing the final device quality. This interface depends on various parameters such as the initial chemical state of the CIGS surface or the chemical bath deposition (CBD) conditions used to grow the CdS layer. In this paper, XPS studies of buried interfaces were carried out by using gradual sputter etch. We have investigated interfaces on CIGS submitted or not to an aqueous bromine solution treatment. This chemical treatment leads to the formation of a Se° film on the CIGS surface, leaving a specular surface, which can be removed by a KCN treatment. The Se3d core level, which is probably the most interesting probe to provide a fine XPS characterization of the CIGS surface, was used to follow a chemical reactivity of interface during CdS growth. In this work, we present a detailed study of the evolution of the Se signal at CIGS surface and across the CIGS/CdS interfaces.We discuss problems of nucleation and growth of CdS layer on well defined CIGS surfaces.
M3 - Conference contribution
AN - SCOPUS:33745959985
SN - 1566774330
SN - 9781566774338
T3 - Proceedings - Electrochemical Society
SP - 31
EP - 40
BT - Chemical Solution Deposition of Semiconducting and Non-Metallic Films - Proceedings of the International Symposium
T2 - 203rd Electrochemical Society Meeting
Y2 - 27 April 2003 through 2 May 2003
ER -