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Signature of resonant Rayleigh scattering from microcavity polaritons: Angularly peaked coherent emission

  • J. Bloch
  • , D. Birkedal
  • , J. Shah
  • , V. Thierry-Mieg

Research output: Contribution to conferencePaperpeer-review

Abstract

The measurement of resonant Rayleigh scattering (RRS) in semiconductor microcavities have been investigated using ultrafast spectral interferometry. The measurements identifies the RRS component of the secondary radiation, and distinguishes between RRS and photoluminescence. The sample is a GaAs cavity with a single 8 nm Ga0.96In0.04As quantum well at the anti-node, surrounded by two Ga0.9Al0.1As/AlAs Bragg mirrors. The unambiguous identification of RRS, and its angular distribution, dynamics, and dependence on cavity detuning, provide unique complementary information on microcavities.

Original languageEnglish
Pages302-303
Number of pages2
Publication statusPublished - 1 Jan 1999
Externally publishedYes
EventProceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99) - Baltimore, MD, USA
Duration: 23 May 199928 May 1999

Conference

ConferenceProceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99)
CityBaltimore, MD, USA
Period23/05/9928/05/99

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