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Simulation framework for barrier lowering in Schottky barrier MOSFETs

  • Mike Schwarz
  • , John P. Snyder
  • , Tillmann Krauss
  • , Udo Schwalke
  • , Laurie E. Calvet
  • , Alexander Kloes
  • JCap LLC
  • Technische Universität Darmstadt
  • Université Paris-Saclay
  • Technische Hochschule Mittelhessen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper we present a simulation framework to account for the Schottky barrier lowering models in SB-MOSFETs within the Synopsys TCAD Sentaurus tool-chain. The improved Schottky barrier lowering model for field emission is considered. A strategy to extract the different current components and thus predict accurately the on- and off-current regions are adressed.

Original languageEnglish
Title of host publicationProceedings of the 24th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2017
EditorsAndrzej Napieralski
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages149-153
Number of pages5
ISBN (Electronic)9788363578114
DOIs
Publication statusPublished - 8 Aug 2017
Externally publishedYes
Event24th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2017 - Bydgoszcz, Poland
Duration: 22 Jun 201724 Jun 2017

Publication series

NameProceedings of the 24th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2017

Conference

Conference24th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2017
Country/TerritoryPoland
CityBydgoszcz
Period22/06/1724/06/17

Keywords

  • 2D Poisson equation
  • DoubleGate (DG) MOSFET
  • Schottky barrier
  • Synopsys
  • TCAD
  • device modeling
  • field emission
  • framework
  • thermionic and tunneling current
  • thermionic emission

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