Simultaneous Bifurcation Diagrams of Carrier Number and Optical Intensity of External Cavity Laser

C. Y. Chang; Daeyoung Choi; A. Locquet; Michael J. Wishon; K. Merghem; Abderrahim Ramdanem; François Lelarge; A. Martinez; D. S. Citrin

Simultaneous Bifurcation Diagrams of Carrier Number and Optical Intensity of External Cavity Laser

C. Y. Chang
, Daeyoung Choi
, A. Locquet
, Michael J. Wishon
, K. Merghem
, Abderrahim Ramdanem
, François Lelarge
, A. Martinez
, D. S. Citrin

Research output: Contribution to journal › Conference article › peer-review

Abstract

We present a simultaneous measurement of the route to chaos of the optical intensity and carrier density as the feedback strength is increased in an external cavity semiconductor laser (ECL). The intensity is measured with a high-speed photodetector while the carrier dynamics is obtained through a measurement of the dynamic voltage across the laser diode injection terminals. Both measurements demonstrate a route to chaos that stems from the undamping of the relaxation oscillation and provide confirmation of the predictions of the Lang and Kobayashi model concerning the routes to chaos.

Original language	English
Article number	JW2A.72
Journal	Optics InfoBase Conference Papers
Publication status	Published - 1 Jan 2016
Event	CLEO: Applications and Technology, CLEO AT 2016 - San Jose, United States Duration: 5 Jun 2016 → 10 Jun 2016

Cite this

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title = "Simultaneous Bifurcation Diagrams of Carrier Number and Optical Intensity of External Cavity Laser",

abstract = "We present a simultaneous measurement of the route to chaos of the optical intensity and carrier density as the feedback strength is increased in an external cavity semiconductor laser (ECL). The intensity is measured with a high-speed photodetector while the carrier dynamics is obtained through a measurement of the dynamic voltage across the laser diode injection terminals. Both measurements demonstrate a route to chaos that stems from the undamping of the relaxation oscillation and provide confirmation of the predictions of the Lang and Kobayashi model concerning the routes to chaos.",

author = "Chang, \{C. Y.\} and Daeyoung Choi and A. Locquet and Wishon, \{Michael J.\} and K. Merghem and Abderrahim Ramdanem and Fran{\c c}ois Lelarge and A. Martinez and Citrin, \{D. S.\}",

note = "Publisher Copyright: {\textcopyright} OSA 2016.; CLEO: Applications and Technology, CLEO AT 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

year = "2016",

month = jan,

day = "1",

language = "English",

journal = "Optics InfoBase Conference Papers",

issn = "2162-2701",

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TY - JOUR

T1 - Simultaneous Bifurcation Diagrams of Carrier Number and Optical Intensity of External Cavity Laser

AU - Chang, C. Y.

AU - Choi, Daeyoung

AU - Locquet, A.

AU - Wishon, Michael J.

AU - Merghem, K.

AU - Ramdanem, Abderrahim

AU - Lelarge, François

AU - Martinez, A.

AU - Citrin, D. S.

PY - 2016/1/1

Y1 - 2016/1/1

N2 - We present a simultaneous measurement of the route to chaos of the optical intensity and carrier density as the feedback strength is increased in an external cavity semiconductor laser (ECL). The intensity is measured with a high-speed photodetector while the carrier dynamics is obtained through a measurement of the dynamic voltage across the laser diode injection terminals. Both measurements demonstrate a route to chaos that stems from the undamping of the relaxation oscillation and provide confirmation of the predictions of the Lang and Kobayashi model concerning the routes to chaos.

AB - We present a simultaneous measurement of the route to chaos of the optical intensity and carrier density as the feedback strength is increased in an external cavity semiconductor laser (ECL). The intensity is measured with a high-speed photodetector while the carrier dynamics is obtained through a measurement of the dynamic voltage across the laser diode injection terminals. Both measurements demonstrate a route to chaos that stems from the undamping of the relaxation oscillation and provide confirmation of the predictions of the Lang and Kobayashi model concerning the routes to chaos.

M3 - Conference article

AN - SCOPUS:85136366764

SN - 2162-2701

JO - Optics InfoBase Conference Papers

JF - Optics InfoBase Conference Papers

M1 - JW2A.72

T2 - CLEO: Applications and Technology, CLEO AT 2016

Y2 - 5 June 2016 through 10 June 2016

ER -

Simultaneous Bifurcation Diagrams of Carrier Number and Optical Intensity of External Cavity Laser

Abstract

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