Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities

V. Bouffetier; M. P. Valdivia; L. Ceurvorst; D. Stutman; G. Rigon; B. Albertazzi; M. Koenig; T. Pikuz; N. Ozaki; H. Nakamura; Y. Hironaka; K. Miyanishi; T. Yabuuchi; T. Togashi; K. Sueda; M. Yabashi; T. Goudal; D. Mancelli; A. Casner; G. Pérez-Callejo

doi:10.1063/5.0307618

Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities

V. Bouffetier
, M. P. Valdivia
, L. Ceurvorst
, D. Stutman
, G. Rigon
, B. Albertazzi
, M. Koenig
, T. Pikuz
, N. Ozaki
, H. Nakamura
, Y. Hironaka
, K. Miyanishi
, T. Yabuuchi
, T. Togashi
, K. Sueda
, M. Yabashi
, T. Goudal
, D. Mancelli
, A. Casner
, G. Pérez-Callejo

Institute of Radiooncology - OncoRay
Stanford Linear Accelerator Center
University of Rochester Laboratory for Laser Energetics
Horia Hulubei National Institute of Physics and Nuclear Engineering
Centre national de la recherche scientifique
Osaka University
RIKEN SPring-8 Center
JASRI/SPring-8
CEA/UVSQ/CNRS
CELIA, Université Bordeaux i, UMR 5107 (CNRS, Bordeaux 1, CEA)
Universidad de Valladolid

Research output: Contribution to journal › Article › peer-review

Abstract

X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.

Original language	English
Article number	123508
Journal	Review of Scientific Instruments
Volume	96
Issue number	12
DOIs	https://doi.org/10.1063/5.0307618
Publication status	Published - 1 Dec 2025

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Bouffetier, V., Valdivia, M. P., Ceurvorst, L., Stutman, D., Rigon, G., Albertazzi, B., Koenig, M., Pikuz, T., Ozaki, N., Nakamura, H., Hironaka, Y., Miyanishi, K., Yabuuchi, T., Togashi, T., Sueda, K., Yabashi, M., Goudal, T., Mancelli, D., Casner, A., & Pérez-Callejo, G. (2025). Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities. Review of Scientific Instruments, 96(12), Article 123508. https://doi.org/10.1063/5.0307618

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title = "Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities",

abstract = "X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.",

author = "V. Bouffetier and Valdivia, \{M. P.\} and L. Ceurvorst and D. Stutman and G. Rigon and B. Albertazzi and M. Koenig and T. Pikuz and N. Ozaki and H. Nakamura and Y. Hironaka and K. Miyanishi and T. Yabuuchi and T. Togashi and K. Sueda and M. Yabashi and T. Goudal and D. Mancelli and A. Casner and G. P{\'e}rez-Callejo",

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Bouffetier, V, Valdivia, MP, Ceurvorst, L, Stutman, D, Rigon, G, Albertazzi, B , Koenig, M, Pikuz, T, Ozaki, N, Nakamura, H, Hironaka, Y, Miyanishi, K, Yabuuchi, T, Togashi, T, Sueda, K, Yabashi, M, Goudal, T, Mancelli, D, Casner, A & Pérez-Callejo, G 2025, 'Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities', Review of Scientific Instruments, vol. 96, no. 12, 123508. https://doi.org/10.1063/5.0307618

TY - JOUR

T1 - Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities

AU - Bouffetier, V.

AU - Valdivia, M. P.

AU - Ceurvorst, L.

AU - Stutman, D.

AU - Rigon, G.

AU - Albertazzi, B.

AU - Koenig, M.

AU - Pikuz, T.

AU - Ozaki, N.

AU - Nakamura, H.

AU - Hironaka, Y.

AU - Miyanishi, K.

AU - Yabuuchi, T.

AU - Togashi, T.

AU - Sueda, K.

AU - Yabashi, M.

AU - Goudal, T.

AU - Mancelli, D.

AU - Casner, A.

AU - Pérez-Callejo, G.

PY - 2025/12/1

Y1 - 2025/12/1

N2 - X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.

AB - X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.

UR - https://www.scopus.com/pages/publications/105024621620

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DO - 10.1063/5.0307618

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VL - 96

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 12

M1 - 123508

ER -

Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities

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