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Single-shot wavefront characterization of high topological charge extreme-ultraviolet vortex

  • A. K. Pandey
  • , O. Guilbaud
  • , F. Sanson
  • , I. Papagiannouli
  • , A. Kabacinski
  • , F. Tissandier
  • , F. Harms
  • , G. Beaugrand
  • , G. Dovillaire
  • , E. Baynard
  • , J. Demailly
  • , B. Lucas
  • , O. Neveu
  • , M. Pittman
  • , D. Ros
  • , S. Sebban
  • , Ph Balcou
  • , S. Kazamias
  • Université Paris-Saclay
  • Cité de la Photonics
  • Laboratory d'Optique Appliquée, ENSTA, CNRS-École Polytechnique
  • Imagine Optic
  • Univ. Bordeaux

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present an experimental intensity and wavefront characterization of the infrared vortex driver as well as the extreme ultraviolet vortex obtained through high harmonic generation in an extended generation medium. In a loose focusing geometry, an intense vortex beam obtained through phase-matched absorption-limited high harmonic generation in a 15 mm long Argon filled gas-cell permits single-shot characterization of the vortex structure. Moreover, our study validates the multiplicative law of momentum conservation even for such an extended generation medium.

Original languageEnglish
Title of host publicationInternational Conference on X-Ray Lasers 2020
EditorsDavide Bleiner
PublisherSPIE
ISBN (Electronic)9781510646186
DOIs
Publication statusPublished - 1 Jan 2021
EventInternational Conference on X-Ray Lasers 2020 - Virtual, Online
Duration: 8 Dec 202010 Dec 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11886
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Conference on X-Ray Lasers 2020
CityVirtual, Online
Period8/12/2010/12/20

Keywords

  • EUV vortex
  • EUV wavefront metrology
  • High-harmonic generation
  • Photon orbital angular momentum

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