Source-pull and multiharmonic Load-Pull measurements based on sixport techniques

G. Berghoff; O. Gibrat; E. Bergeault; B. Huyart; L. Jallet

Source-pull and multiharmonic Load-Pull measurements based on sixport techniques

G. Berghoff
, O. Gibrat
, E. Bergeault
, B. Huyart
, L. Jallet

Telecom Paris

Research output: Contribution to journal › Conference article › peer-review

Abstract

An original measurement system for nonlinear microwave power transistor characterization, using sixport reflectometers, is presented. It allows independent active tuning of the output impedances at f₀ and 2f₀ (multiharmonic Load-Pull) and variation of the source impedance at the input port at f₀ (Source-Pull). Experimental results are shown for a commercial GaAs MESFET power transistor.

Original language	English
Pages (from-to)	492-493
Number of pages	2
Journal	CPEM Digest (Conference on Precision Electromagnetic Measurements)
Publication status	Published - 1 Dec 1998
Event	Proceedings of the 1998 Conference Precision Electromagnetic Measurements - Washington, DC, USA Duration: 6 Jul 1998 → 10 Jul 1998

Cite this

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title = "Source-pull and multiharmonic Load-Pull measurements based on sixport techniques",

abstract = "An original measurement system for nonlinear microwave power transistor characterization, using sixport reflectometers, is presented. It allows independent active tuning of the output impedances at f0 and 2f0 (multiharmonic Load-Pull) and variation of the source impedance at the input port at f0 (Source-Pull). Experimental results are shown for a commercial GaAs MESFET power transistor.",

author = "G. Berghoff and O. Gibrat and E. Bergeault and B. Huyart and L. Jallet",

year = "1998",

month = dec,

day = "1",

language = "English",

pages = "492--493",

journal = "CPEM Digest (Conference on Precision Electromagnetic Measurements)",

issn = "0589-1485",

note = "Proceedings of the 1998 Conference Precision Electromagnetic Measurements ; Conference date: 06-07-1998 Through 10-07-1998",

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TY - JOUR

T1 - Source-pull and multiharmonic Load-Pull measurements based on sixport techniques

AU - Berghoff, G.

AU - Gibrat, O.

AU - Bergeault, E.

AU - Huyart, B.

AU - Jallet, L.

PY - 1998/12/1

Y1 - 1998/12/1

N2 - An original measurement system for nonlinear microwave power transistor characterization, using sixport reflectometers, is presented. It allows independent active tuning of the output impedances at f0 and 2f0 (multiharmonic Load-Pull) and variation of the source impedance at the input port at f0 (Source-Pull). Experimental results are shown for a commercial GaAs MESFET power transistor.

AB - An original measurement system for nonlinear microwave power transistor characterization, using sixport reflectometers, is presented. It allows independent active tuning of the output impedances at f0 and 2f0 (multiharmonic Load-Pull) and variation of the source impedance at the input port at f0 (Source-Pull). Experimental results are shown for a commercial GaAs MESFET power transistor.

UR - https://www.scopus.com/pages/publications/0032287579

M3 - Conference article

AN - SCOPUS:0032287579

SN - 0589-1485

SP - 492

EP - 493

JO - CPEM Digest (Conference on Precision Electromagnetic Measurements)

JF - CPEM Digest (Conference on Precision Electromagnetic Measurements)

T2 - Proceedings of the 1998 Conference Precision Electromagnetic Measurements

Y2 - 6 July 1998 through 10 July 1998

ER -

Source-pull and multiharmonic Load-Pull measurements based on sixport techniques

Abstract

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