@inproceedings{d69e676e291a40019b652366d9f6ccaf,
title = "Spectrally resolved complex transmittance measurements of infrared nanostructured devices",
abstract = "Optical sub-wavelength structures allow to code space-varying complex transmittance functions that induce both amplitude and phase variations on a given wavefront at the micrometer scale. This paves the way to the miniaturization of optical devices based on the spatial coding of the complex transmittance. We describe here a dedicated setup in the infrared range (3-14μm) for the spatial and spectral characterization of such components. The setup combines (i) a quadri-wave lateral shearing interferometer, which enables a two dimensional measurements of phase and amplitude, and (ii) a Fourier Transform Infrared Interferometer for spectral resolution. We present both theoretical simulations and experimental results of the characterization of sub-wavelength gratings.",
keywords = "Infrared, Interferometry, Lateral shearing interferometry, Nanotechnology, Optical analysis, Sub-wavelength structures",
author = "Julien Jaeck and Adrien Fallou and Gr{\'e}gory Vincent and J{\'e}r{\^o}me Primot and Pelouard, \{Jean Luc\} and Riad Ha{\"i}dar",
year = "2012",
month = dec,
day = "1",
doi = "10.1117/12.929742",
language = "English",
isbn = "9780819492104",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Interferometry XVI",
note = "Interferometry XVI: Techniques and Analysis ; Conference date: 13-08-2012 Through 15-08-2012",
}