Abstract
Spin polarization (SP) measurements of the secondary electron yield from ferromagnetic interfaces is a sensitive probe of surface and interface magnetism. By exploiting the jumps of the total photoionization cross section in correspondence of the L-edge excitation in transition metals one introduces a chemical sensitivity in the SP via the enhancement of the secondary emission from a specific magnetic or non magnetic specie at the interface. The hν-dependence of the SP in overlayer experiments allows to derive accurately the total and spin-dependent attenuation lengths for secondary electrons in non-magnetic and ferromagnetic materials.
| Original language | English |
|---|---|
| Pages (from-to) | C9-175-178 |
| Journal | Journal De Physique. IV : JP |
| Volume | 4 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1 Jan 1994 |
| Externally published | Yes |
| Event | Proceedings of the European Symposium on Frontiers in Science and Technology with Synchrotron Radiation - Aix-en-Provence, Fr Duration: 5 Apr 1994 → 8 Apr 1994 |