Spin precession of light holes in the spin-orbit field of strained GaAs nanowires

  • D. Paget
  • , T. Amand
  • , H. Hijazi
  • , A. C.H. Rowe
  • , G. Monier
  • , E. Gil
  • , F. Cadiz
  • , C. Robert Goumet
  • , Y. André

Research output: Contribution to journalArticlepeer-review

Abstract

We have used a polarized spatially resolved microluminescence technique to investigate photocarrier charge and spin transport at 6 K in a GaAs nanowire (NW; n-type doping level ≈1017cm-3). Because of the difference in expansion coefficients of the NW and of its SiO2 substrate, the NW is under strain, as revealed by the splitting between light- and heavy-hole emissions in the luminescence intensity spectrum. Light valence levels lie above the heavy valence ones, which is attributed as being caused by a tensile strain along both the axial and the lateral directions of the NW, equivalent to a compressive strain in the direction of light excitation. The symmetry group of the perturbed nanowire is then lowered to C2v. No spin polarization can be evidenced for the heavy valence levels. The electron spin polarization decays up to a distance of 5μm from the excitation spot, because of spin relaxation, and stays constant for larger distances because of the increased value of the drift velocity. Remarkably, the light-hole spin polarization exhibits damped spatial oscillations over as much as 5μm. Analysis of the effect of strain on valence states shows that these oscillations are caused by the spin-orbit interaction in the light valence level. It is found that, for the C2v point group, the corresponding Hamiltonian is linear in momentum. This spin-orbit interaction causes coherent oscillations rather than a spin relaxation process since transport essentially has a drift character in the internal electric field. The equivalent effective magnetic field induced by spin-orbit interaction and strain is, taking a light-hole g factor of 1, of the order of 60mT.

Original languageEnglish
Article number205402
JournalPhysical Review B
Volume108
Issue number20
DOIs
Publication statusPublished - 15 Nov 2023

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