Stability of straight delamination blisters

Research output: Contribution to journalArticlepeer-review

Abstract

We consider the buckle-driven delamination of biaxially compressed thin films. Telephone-cord-like patterns observed in experiments are explained as a result of the buckling behavior of the film. We perform a stability analysis of a straight blister. A mechanism of instability causing undulations in an advancing finger of delamination is pointed out, which we claim to be the basic phenomenon explaining the zigzag pattern. We predict a transition to a varicose (unobserved as yet) pattern at low Poisson ratios.

Original languageEnglish
Pages (from-to)4124-4127
Number of pages4
JournalPhysical Review Letters
Volume83
Issue number20
DOIs
Publication statusPublished - 1 Jan 1999
Externally publishedYes

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