Abstract
We have measured by X-ray resonant magnetic scattering the stripe domain nucleation field and the stripe domain critical width of FePd epitaxial films in a wide temperature range. A detailed quantitative analysis of our data in the framework of the rigorous theory of domain nucleation in thin films, allowed to determine the temperature dependence of both the exchange stiffness A and the anisotropy constant Ku. The proposed approach can be applied to thin magnetic films with perpendicular magnetic anisotropy, thus providing a way to measure A in a relevant class of magnetic materials.
| Original language | English |
|---|---|
| Pages (from-to) | e895-e897 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 272-276 |
| Issue number | SUPPL. 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2004 |
| Externally published | Yes |
Keywords
- Anisotropy-thin films
- Magnetic domains
- Magnetic films
- Micromagnetism
- X-ray resonant magnetic scattering