Stripe domains nucleation observed by X-ray magnetic scattering: Temperature variation of exchange and anisotropy

M. Mulazzi, K. Chesnel, A. Marty, G. Asti, M. Ghidini, M. Solzi, M. Belakhovsky, N. Jaouen, J. M. Tonnerre, F. Sirotti

Research output: Contribution to journalArticlepeer-review

Abstract

We have measured by X-ray resonant magnetic scattering the stripe domain nucleation field and the stripe domain critical width of FePd epitaxial films in a wide temperature range. A detailed quantitative analysis of our data in the framework of the rigorous theory of domain nucleation in thin films, allowed to determine the temperature dependence of both the exchange stiffness A and the anisotropy constant Ku. The proposed approach can be applied to thin magnetic films with perpendicular magnetic anisotropy, thus providing a way to measure A in a relevant class of magnetic materials.

Original languageEnglish
Pages (from-to)e895-e897
JournalJournal of Magnetism and Magnetic Materials
Volume272-276
Issue numberSUPPL. 1
DOIs
Publication statusPublished - 1 Jan 2004
Externally publishedYes

Keywords

  • Anisotropy-thin films
  • Magnetic domains
  • Magnetic films
  • Micromagnetism
  • X-ray resonant magnetic scattering

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