Abstract
The photoconductivity (σph) of highly crystallized dense undoped hydrogenated microcrystalline silicon (μc-Si:H) films was measured as a function of light illumination over a wide temperature range (∼15-325 K). A thermal quenching behavior in σph was observed at ∼240 K. The photoconductivity exponent (γ) was found to be sublinear with γ as low as 0.13. A density of states (DOS) profile having a steep conduction band tail, and valence band tail with two distinct distributions was found to be necessary to understand the electronic transport behavior in the inherently heterogeneous μc-Si:H films.
| Original language | English |
|---|---|
| Pages (from-to) | 1172-1175 |
| Number of pages | 4 |
| Journal | Journal of Non-Crystalline Solids |
| Volume | 352 |
| Issue number | 9-20 SPEC. ISS. |
| DOIs | |
| Publication status | Published - 15 Jun 2006 |
Keywords
- Density of states
- Electronic transport properties
- Photoconductivity
- Silicon
- Thin films