Submicron digital in-line holographic microscopy at 32nm with high-order harmonics

Anne Sophie Morlens; Julien Gautier; Gilles Rey; Philippe Zeitoun; Jean Pascal Caumes; Marylène Kos-Rosset; Hamed Merdji; Sophie Kazamias; Kevin Cassou; Marta Fajardo

doi:10.1109/LEOS.2006.279113

Submicron digital in-line holographic microscopy at 32nm with high-order harmonics

Anne Sophie Morlens
, Julien Gautier
, Gilles Rey
, Philippe Zeitoun
, Jean Pascal Caumes
, Marylène Kos-Rosset
, Hamed Merdji
, Sophie Kazamias
, Kevin Cassou
, Marta Fajardo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	893-894
Number of pages	2
ISBN (Print)	0780395557, 9780780395558
DOIs	https://doi.org/10.1109/LEOS.2006.279113
Publication status	Published - 1 Jan 2006
Event	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada Duration: 29 Oct 2006 → 2 Nov 2006

Publication series

Name	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)	1092-8081

Conference

Conference	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Country/Territory	Canada
City	Montreal, QC
Period	29/10/06 → 2/11/06

Access to Document

10.1109/LEOS.2006.279113

Cite this

Morlens, A. S., Gautier, J., Rey, G., Zeitoun, P., Caumes, J. P., Kos-Rosset, M., Merdji, H., Kazamias, S., Cassou, K., & Fajardo, M. (2006). Submicron digital in-line holographic microscopy at 32nm with high-order harmonics. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS (pp. 893-894). Article 4054475 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOS.2006.279113

Morlens, Anne Sophie ; Gautier, Julien ; Rey, Gilles et al. / Submicron digital in-line holographic microscopy at 32nm with high-order harmonics. 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc., 2006. pp. 893-894 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

@inproceedings{18ca9e728a074ecfb9611680b1c15e91,

title = "Submicron digital in-line holographic microscopy at 32nm with high-order harmonics",

author = "Morlens, \{Anne Sophie\} and Julien Gautier and Gilles Rey and Philippe Zeitoun and Caumes, \{Jean Pascal\} and Maryl{\`e}ne Kos-Rosset and Hamed Merdji and Sophie Kazamias and Kevin Cassou and Marta Fajardo",

year = "2006",

month = jan,

day = "1",

doi = "10.1109/LEOS.2006.279113",

language = "English",

isbn = "0780395557",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "893--894",

booktitle = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS",

note = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS ; Conference date: 29-10-2006 Through 02-11-2006",

}

Morlens, AS, Gautier, J, Rey, G, Zeitoun, P, Caumes, JP, Kos-Rosset, M, Merdji, H, Kazamias, S, Cassou, K & Fajardo, M 2006, Submicron digital in-line holographic microscopy at 32nm with high-order harmonics. in 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS., 4054475, Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, Institute of Electrical and Electronics Engineers Inc., pp. 893-894, 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS, Montreal, QC, Canada, 29/10/06. https://doi.org/10.1109/LEOS.2006.279113

Submicron digital in-line holographic microscopy at 32nm with high-order harmonics. / Morlens, Anne Sophie; Gautier, Julien; Rey, Gilles et al.
19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc., 2006. p. 893-894 4054475 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Submicron digital in-line holographic microscopy at 32nm with high-order harmonics

AU - Morlens, Anne Sophie

AU - Gautier, Julien

AU - Rey, Gilles

AU - Zeitoun, Philippe

AU - Caumes, Jean Pascal

AU - Kos-Rosset, Marylène

AU - Merdji, Hamed

AU - Kazamias, Sophie

AU - Cassou, Kevin

AU - Fajardo, Marta

PY - 2006/1/1

Y1 - 2006/1/1

U2 - 10.1109/LEOS.2006.279113

DO - 10.1109/LEOS.2006.279113

M3 - Conference contribution

AN - SCOPUS:39049136391

SN - 0780395557

SN - 9780780395558

T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

SP - 893

EP - 894

BT - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

Y2 - 29 October 2006 through 2 November 2006

ER -

Morlens AS, Gautier J, Rey G, Zeitoun P, Caumes JP, Kos-Rosset M et al. Submicron digital in-line holographic microscopy at 32nm with high-order harmonics. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc. 2006. p. 893-894. 4054475. (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). doi: 10.1109/LEOS.2006.279113