Subpicosecond X-ray diffraction mesasurement of InSb ultrafast melting

  • Antoine Rousse
  • , S. Fourmaux
  • , S. Sebban
  • , D. Hulin
  • , Christian Rischel
  • , Ingo Uschmann
  • , Eckhart Förster
  • , Jean Paul Geindre
  • , Patrick Audebert
  • , Jean Claude Gauthier

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Subpicosecond atomic behaviour following 100 fs laser excitation is investigated in InSb by time-resolved X-ray diffraction. The process of non-thermal melting is observed and characterized in the subpicosecond time-scale.

Original languageEnglish
Title of host publicationInternational Conference on Ultrafast Phenomena, UP 2000
PublisherOptica Publishing Group (formerly OSA)
Pages329-331
Number of pages3
ISBN (Electronic)1557526400
Publication statusPublished - 1 Jan 2000
EventInternational Conference on Ultrafast Phenomena, UP 2000 - Charleston, United States
Duration: 9 Jul 2000 → …

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceInternational Conference on Ultrafast Phenomena, UP 2000
Country/TerritoryUnited States
CityCharleston
Period9/07/00 → …

Fingerprint

Dive into the research topics of 'Subpicosecond X-ray diffraction mesasurement of InSb ultrafast melting'. Together they form a unique fingerprint.

Cite this