Surface defect induced by strong electric field probed by soft x-ray laser interferometry

Francois Albert; Philippe Zeitoun; D. Joyeux; M. Boussoukaya; A. Carillon; S. Hubert; P. Jaeglé; G. Jamelot; A. Klisnick; D. Phalippou; D. Ros; S. Sebban; A. Zeitoun-Fakiris

doi:10.1117/12.308642

Surface defect induced by strong electric field probed by soft x-ray laser interferometry

Francois Albert
, Philippe Zeitoun
, D. Joyeux
, M. Boussoukaya
, A. Carillon
, S. Hubert
, P. Jaeglé
, G. Jamelot
, A. Klisnick
, D. Phalippou
, D. Ros
, S. Sebban
, A. Zeitoun-Fakiris

Université Paris-Saclay

Research output: Contribution to journal › Conference article › peer-review

Abstract

We use X-ray laser interferometry to probe defects induced by a strong electric field on niobium surface. Niobium has been chosen on account of its frequent use in superconductive cavities of particle accelerators. The X-ray laser emits bright, 50ps-duration pulses at λ = 21.2 nm. The beam is reflected on the niobium surface under grazing incidence. The interferometer is of the wave-front division type. Interferograms are single shot recorded, which enables to probe 'instantaneous' defect morphology. We observed appearance and evolution of defects between 14 MV/m and 35 MV/m. The vertical set amplitude is of 10-20 nm. The defect structure has been observed to shift by 500 μm along the metal surface under a constant 35 MV/m electric field, during the 20 minutes time interval between two laser shots.

Original language	English
Pages (from-to)	376-383
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3404
DOIs	https://doi.org/10.1117/12.308642
Publication status	Published - 1 Dec 1997
Externally published	Yes
Event	ALT 1997 International Conference on Laser Surface Processing - Limoges, France Duration: 8 Sept 1997 → 12 Sept 1997

Keywords

Niobium
Soft x-ray laser
Strong electric field
Superconductive cavities
Surface defect analysis
X-UV interferometry

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10.1117/12.308642

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Albert, F., Zeitoun, P., Joyeux, D., Boussoukaya, M., Carillon, A., Hubert, S., Jaeglé, P., Jamelot, G., Klisnick, A., Phalippou, D., Ros, D., Sebban, S., & Zeitoun-Fakiris, A. (1997). Surface defect induced by strong electric field probed by soft x-ray laser interferometry. Proceedings of SPIE - The International Society for Optical Engineering, 3404, 376-383. https://doi.org/10.1117/12.308642

@article{97fe44067d4d46b39fe4b39db042938e,

title = "Surface defect induced by strong electric field probed by soft x-ray laser interferometry",

abstract = "We use X-ray laser interferometry to probe defects induced by a strong electric field on niobium surface. Niobium has been chosen on account of its frequent use in superconductive cavities of particle accelerators. The X-ray laser emits bright, 50ps-duration pulses at λ = 21.2 nm. The beam is reflected on the niobium surface under grazing incidence. The interferometer is of the wave-front division type. Interferograms are single shot recorded, which enables to probe 'instantaneous' defect morphology. We observed appearance and evolution of defects between 14 MV/m and 35 MV/m. The vertical set amplitude is of 10-20 nm. The defect structure has been observed to shift by 500 μm along the metal surface under a constant 35 MV/m electric field, during the 20 minutes time interval between two laser shots.",

keywords = "Niobium, Soft x-ray laser, Strong electric field, Superconductive cavities, Surface defect analysis, X-UV interferometry",

author = "Francois Albert and Philippe Zeitoun and D. Joyeux and M. Boussoukaya and A. Carillon and S. Hubert and P. Jaegl{\'e} and G. Jamelot and A. Klisnick and D. Phalippou and D. Ros and S. Sebban and A. Zeitoun-Fakiris",

year = "1997",

month = dec,

day = "1",

doi = "10.1117/12.308642",

language = "English",

volume = "3404",

pages = "376--383",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

note = "ALT 1997 International Conference on Laser Surface Processing ; Conference date: 08-09-1997 Through 12-09-1997",

}

Albert, F, Zeitoun, P, Joyeux, D, Boussoukaya, M, Carillon, A, Hubert, S, Jaeglé, P, Jamelot, G, Klisnick, A, Phalippou, D, Ros, D, Sebban, S & Zeitoun-Fakiris, A 1997, 'Surface defect induced by strong electric field probed by soft x-ray laser interferometry', Proceedings of SPIE - The International Society for Optical Engineering, vol. 3404, pp. 376-383. https://doi.org/10.1117/12.308642

TY - JOUR

T1 - Surface defect induced by strong electric field probed by soft x-ray laser interferometry

AU - Albert, Francois

AU - Zeitoun, Philippe

AU - Joyeux, D.

AU - Boussoukaya, M.

AU - Carillon, A.

AU - Hubert, S.

AU - Jaeglé, P.

AU - Jamelot, G.

AU - Klisnick, A.

AU - Phalippou, D.

AU - Ros, D.

AU - Sebban, S.

AU - Zeitoun-Fakiris, A.

PY - 1997/12/1

Y1 - 1997/12/1

N2 - We use X-ray laser interferometry to probe defects induced by a strong electric field on niobium surface. Niobium has been chosen on account of its frequent use in superconductive cavities of particle accelerators. The X-ray laser emits bright, 50ps-duration pulses at λ = 21.2 nm. The beam is reflected on the niobium surface under grazing incidence. The interferometer is of the wave-front division type. Interferograms are single shot recorded, which enables to probe 'instantaneous' defect morphology. We observed appearance and evolution of defects between 14 MV/m and 35 MV/m. The vertical set amplitude is of 10-20 nm. The defect structure has been observed to shift by 500 μm along the metal surface under a constant 35 MV/m electric field, during the 20 minutes time interval between two laser shots.

AB - We use X-ray laser interferometry to probe defects induced by a strong electric field on niobium surface. Niobium has been chosen on account of its frequent use in superconductive cavities of particle accelerators. The X-ray laser emits bright, 50ps-duration pulses at λ = 21.2 nm. The beam is reflected on the niobium surface under grazing incidence. The interferometer is of the wave-front division type. Interferograms are single shot recorded, which enables to probe 'instantaneous' defect morphology. We observed appearance and evolution of defects between 14 MV/m and 35 MV/m. The vertical set amplitude is of 10-20 nm. The defect structure has been observed to shift by 500 μm along the metal surface under a constant 35 MV/m electric field, during the 20 minutes time interval between two laser shots.

KW - Niobium

KW - Soft x-ray laser

KW - Strong electric field

KW - Superconductive cavities

KW - Surface defect analysis

KW - X-UV interferometry

U2 - 10.1117/12.308642

DO - 10.1117/12.308642

M3 - Conference article

AN - SCOPUS:18544380188

SN - 0277-786X

VL - 3404

SP - 376

EP - 383

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - ALT 1997 International Conference on Laser Surface Processing

Y2 - 8 September 1997 through 12 September 1997

ER -

Surface defect induced by strong electric field probed by soft x-ray laser interferometry

Abstract

Keywords

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