Surface X-ray dichroism of rare-earths

M. Sacchi, O. Sakho, F. Sirotti, X. Jin, G. Rossi

Research output: Contribution to journalArticlepeer-review

Abstract

The two-dimensional nature of surface adsorbate layers of rare earth atoms and of epitaxial interfaces of rare earths on Si(111)-7 × 7 is reflected in the axial symmetry of the local field at the rare earth site. The induced splitting of the ground state of the rare earth is probed by linear polarized X-ray absorption spectroscopy (XAS), which exhibits strong dichroism.

Original languageEnglish
Pages (from-to)346-349
Number of pages4
JournalSurface Science
Volume251-252
Issue numberC
DOIs
Publication statusPublished - 1 Jul 1991
Externally publishedYes

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