TEM observations of nanometer thick cobalt deposits in alumina sandwiches

F. Fettar; J. L. Maurice; F. Petroff; L. F. Schelp; A. Vaurès; A. Fert

doi:10.1016/S0040-6090(97)01105-X

TEM observations of nanometer thick cobalt deposits in alumina sandwiches

F. Fettar
, J. L. Maurice
, F. Petroff
, L. F. Schelp
, A. Vaurès
, A. Fert

Thales Group

Research output: Contribution to journal › Article › peer-review

Abstract

We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.

Original language	English
Pages (from-to)	120-123
Number of pages	4
Journal	Thin Solid Films
Volume	319
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(97)01105-X
Publication status	Published - 29 Apr 1998
Externally published	Yes

Keywords

Amorphous alumina
Cobalt clusters
Transmission electron microscopy

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10.1016/S0040-6090(97)01105-X

Cite this

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title = "TEM observations of nanometer thick cobalt deposits in alumina sandwiches",

abstract = "We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.",

keywords = "Amorphous alumina, Cobalt clusters, Transmission electron microscopy",

author = "F. Fettar and Maurice, \{J. L.\} and F. Petroff and Schelp, \{L. F.\} and A. Vaur{\`e}s and A. Fert",

year = "1998",

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doi = "10.1016/S0040-6090(97)01105-X",

language = "English",

volume = "319",

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TY - JOUR

T1 - TEM observations of nanometer thick cobalt deposits in alumina sandwiches

AU - Fettar, F.

AU - Maurice, J. L.

AU - Petroff, F.

AU - Schelp, L. F.

AU - Vaurès, A.

AU - Fert, A.

PY - 1998/4/29

Y1 - 1998/4/29

N2 - We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.

AB - We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data.

KW - Amorphous alumina

KW - Cobalt clusters

KW - Transmission electron microscopy

UR - https://www.scopus.com/pages/publications/0032046255

U2 - 10.1016/S0040-6090(97)01105-X

DO - 10.1016/S0040-6090(97)01105-X

M3 - Article

AN - SCOPUS:0032046255

SN - 0040-6090

VL - 319

SP - 120

EP - 123

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

TEM observations of nanometer thick cobalt deposits in alumina sandwiches

Abstract

Keywords

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