Abstract
The growth mechanisms of microcrystalline silicon thin films at low temperatures (100-250°C) by plasma CVD are still a matter of debate. We have shown that ue-Si:H formation proceeds through four phases (incubation, nucleation, growth and steady state) and that hydrogen plays a key role in this process, particularly during the incubation phase in which hydrogen modifies the amorphous silicon network and forms a highly porous phase where nucleation takes place. In this study we combine in-situ ellipsometry and dark conductivity measurements with ex-situ high resolution transmission electron microscopy to improve our understanding of microcrystalline silicon formation.
| Original language | English |
|---|---|
| Pages (from-to) | 559-563 |
| Number of pages | 5 |
| Journal | Materials Science and Engineering: B |
| Volume | 69-70 |
| DOIs | |
| Publication status | Published - 19 Jan 2000 |
| Externally published | Yes |
| Event | The European Materials Research Society 1999 Spring Meeting, Symposium I: Microcrystalline and Nanocrystalline Semiconductors - Strasbourg, France Duration: 1 Jun 1999 → 4 Jun 1999 |
Keywords
- Hydrogen
- Low temperatures
- Microcrystalline silicon films