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Thermal noise measurements on micro-cantilevers coated with dielectric materials

  • Gianpietro Cagnoli
  • , Vincent Dolique
  • , Jerome Degallaix
  • , Raffaele Flaminio
  • , Daniele Forest
  • , Massimo Granata
  • , Christophe Michel
  • , Nazario Morgado
  • , Laurent Pinard
  • , Felipe Aguilar
  • , Tianjun Li
  • , Mickael Geitner
  • , Ludovic Bellon
  • IGFL, Université de Lyon, Université Lyon 1
  • University of Lyon

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In recent years an increasing number of devices and experiments are shown to be limited by mechanical thermal noise. In particular sub-Hertz laser frequency stabilization and gravitational wave detectors, that are able to measure fluctuations of 10-18 m/√Hz or less, are being limited by thermal noise in the dielectric coatings deposited on mirrors. We present a novel technique of structural relaxation analysis based on the direct thermal noise measurements on micro-cantilevers and we compare it with the results obtained from the mechanical loss measurements. The dielectric coatings are deposited by ion beam sputtering. The results presented here give a loss angle of annealed tantala and as-deposited silica coatings of (3.9 ± 0.4) ṡ 10-4 and (5.8 ± 1.0) ṡ 10-4 respectively, from 10 Hz to 20 kHz.

Original languageEnglish
Title of host publication2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
DOIs
Publication statusPublished - 16 Sept 2013
Externally publishedYes
Event2013 22nd International Conference on Noise and Fluctuations, ICNF 2013 - Montpellier, France
Duration: 24 Jun 2013 → 28 Jun 2013

Publication series

Name2013 22nd International Conference on Noise and Fluctuations, ICNF 2013

Conference

Conference2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
Country/TerritoryFrance
CityMontpellier
Period24/06/13 → 28/06/13

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