Abstract
We show that the origin of the spectral fluctuations frequently observed in tip enhanced Raman spectroscopy (TERS) experiments can be mainly related to the presence of surface-contaminating amorphous carbon-based species. We have monitored the spectral fluctuations originating from the sharp metallic tips used as apertureless near field probes, as well as from commonly used noble metal substrates. A correlation between the tip surface roughness and the carbon-based spectral fluctuations has been revealed. An Au-(1 1 1) bare substrate has been mapped with sub-wavelength resolution by TERS, evidencing the localization of the carbon contaminants on the surface steps and grain boundaries.
| Original language | English |
|---|---|
| Pages (from-to) | 701-705 |
| Number of pages | 5 |
| Journal | Surface Science |
| Volume | 604 |
| Issue number | 7-8 |
| DOIs | |
| Publication status | Published - 15 Apr 2010 |
Keywords
- Au(1 1 1)
- Carbon contamination
- Near-field optics
- Scanning tunnelling microscopy (STM)
- Tip enhanced Raman spectroscopy (TERS)
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