TOF-SIMS imaging of lipids on rat brain sections

David Touboul; Alain Brunelle

doi:10.1007/978-1-4939-1357-2_3

TOF-SIMS imaging of lipids on rat brain sections

David Touboul
, Alain Brunelle

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Since several decades, secondary ion mass spectrometry (SIMS) coupled to time of flight (TOF) is used for atomic or small inorganic/organic fragments imaging on different materials. With the advent of polyatomic ion sources leading to a significant increase of sensitivity in combination with a reasonable spatial resolution (1–10 μm), TOF-SIMS is becoming a more and more popular analytical platform for MS imaging. Even if this technique is limited to small molecules (typically below 1,000 Da), it offers enough sensitivity to detect and locate various classes of lipids directly on the surface of tissue sections. This chapter is thus dedicated to the TOF-SIMS analysis of lipids in positive and negative ion modes on rat brain tissue sections using a bismuth cluster ion source.

Original language	English
Pages (from-to)	21-27
Number of pages	7
Journal	Methods in molecular biology (Clifton, N.J.)
Volume	1203
DOIs	https://doi.org/10.1007/978-1-4939-1357-2_3
Publication status	Published - 1 Jan 2015

Keywords

Lipid
Mass spectrometry imaging
Rat brain
Secondary ion mass spectrometry
Time-of-fight

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10.1007/978-1-4939-1357-2_3

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title = "TOF-SIMS imaging of lipids on rat brain sections",

abstract = "Since several decades, secondary ion mass spectrometry (SIMS) coupled to time of flight (TOF) is used for atomic or small inorganic/organic fragments imaging on different materials. With the advent of polyatomic ion sources leading to a significant increase of sensitivity in combination with a reasonable spatial resolution (1–10 μm), TOF-SIMS is becoming a more and more popular analytical platform for MS imaging. Even if this technique is limited to small molecules (typically below 1,000 Da), it offers enough sensitivity to detect and locate various classes of lipids directly on the surface of tissue sections. This chapter is thus dedicated to the TOF-SIMS analysis of lipids in positive and negative ion modes on rat brain tissue sections using a bismuth cluster ion source.",

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AU - Brunelle, Alain

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AB - Since several decades, secondary ion mass spectrometry (SIMS) coupled to time of flight (TOF) is used for atomic or small inorganic/organic fragments imaging on different materials. With the advent of polyatomic ion sources leading to a significant increase of sensitivity in combination with a reasonable spatial resolution (1–10 μm), TOF-SIMS is becoming a more and more popular analytical platform for MS imaging. Even if this technique is limited to small molecules (typically below 1,000 Da), it offers enough sensitivity to detect and locate various classes of lipids directly on the surface of tissue sections. This chapter is thus dedicated to the TOF-SIMS analysis of lipids in positive and negative ion modes on rat brain tissue sections using a bismuth cluster ion source.

KW - Lipid

KW - Mass spectrometry imaging

KW - Rat brain

KW - Secondary ion mass spectrometry

KW - Time-of-fight

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DO - 10.1007/978-1-4939-1357-2_3

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AN - SCOPUS:84958667254

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JO - Methods in molecular biology (Clifton, N.J.)

JF - Methods in molecular biology (Clifton, N.J.)

ER -

TOF-SIMS imaging of lipids on rat brain sections

Abstract

Keywords

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