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Total-energy tight-binding modelisations of silicon

  • Laboratoire des Solides Irradiés

Research output: Contribution to journalArticlepeer-review

Abstract

We present a systematic comparison of several tight-binding total-energy modelisations of silicon. These modelisations include the tight-binding electronic cohesive energy and a phenomenological description of a repulsive term. We examine both the electronic band gap and various structural properties such as structural stability, bulk modulus, elastic constants, four typical vibrational modes and their Grüneisen constants. We then apply these models to the calculations of the minimised energies of some multivariant grain boundaries. We discuss the influence of the choice of cut radii.

Original languageEnglish
Pages (from-to)388-391
Number of pages4
JournalComputational Materials Science
Volume10
Issue number1-4
DOIs
Publication statusPublished - 1 Jan 1998

Keywords

  • Atomic simulations
  • Silicon
  • Tight binding
  • Total energy

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