Abstract
We construct a diffuse-interface model of two-phase solidification that quantitatively reproduces the classic free boundary problem on solid-liquid interfaces in the thin-interface limit. Convergence tests and comparisons with boundary integral simulations of eutectic growth show good accuracy for steady-state lamellae, but the results for limit cycles depend on the interface thickness through the trijunction behavior. This raises the fundamental issue of diffuse multiple-junction dynamics.
| Original language | English |
|---|---|
| Pages (from-to) | 4 |
| Number of pages | 1 |
| Journal | Physical Review E |
| Volume | 68 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2003 |