Skip to main navigation Skip to search Skip to main content

Towards an Ontological Framework for Validity Frames

  • Rakshit Mittal
  • , Raheleh Eslampanah
  • , Lucas Lima
  • , Hans Vangheluwe
  • , Dominique Blouin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A Validity Frame captures the set of contexts in which a model (and its analysis, often by means of simulation) of a system is able to replace that system with respect to questions about a set of salient properties of interest. Even though the utility of validity frames has been reported in current literature, there does not exist any precise and general definition of the concept. This paper presents our on-going development of a framework for designing and using validity frames. This framework both uses and supports model management. We have developed an ontology in order to precisely define the concepts of the model validity domain. The framework currently consists of ontological definitions integrated in a workflow model that describes a general experiment, validation experiments, and the construction of validity frames. A simple resistor model validation case-study is used as running example to describe the concepts. The validity frames of different resistor models are computed. How to use the framework in different scenarios is sketched.

Original languageEnglish
Title of host publicationProceedings - 2023 ACM/IEEE International Conference on Model Driven Engineering Languages and Systems Companion, MODELS-C 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages801-805
Number of pages5
ISBN (Electronic)9798350324983
DOIs
Publication statusPublished - 1 Jan 2023
Event2023 ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS-C 2023 - Vasteras, Sweden
Duration: 1 Oct 20236 Oct 2023

Publication series

NameProceedings - 2023 ACM/IEEE International Conference on Model Driven Engineering Languages and Systems Companion, MODELS-C 2023

Conference

Conference2023 ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS-C 2023
Country/TerritorySweden
CityVasteras
Period1/10/236/10/23

Keywords

  • experimental frame
  • modeling
  • ontology
  • validation
  • validity frame

Fingerprint

Dive into the research topics of 'Towards an Ontological Framework for Validity Frames'. Together they form a unique fingerprint.

Cite this