@inproceedings{ce0bc10d503143489e0e04d688f64322,
title = "Transient absorption in silicon thin films-based characterization of ultrashort pulses with photon energy above 1.12 eV",
abstract = "We report on the capability of the Frequency-resolved optical switching (FROSt) method for characterizing ultrashort visible pulses using silicon (Si) thin films. We demonstrate that FROSt can effectively characterize sub-20 fs visible pulses and those with energy densities less than 1 nJ/nm using 500 nm thick Si thin films deposited on a sapphire substrate (SOS). The findings demonstrate the potential of FROSt for characterizing low-energy solid-state high harmonics. Additionally, it serves as an ideal method for pulse characterization to enable better control and optimization of ultrashort visible pulses in ultrafast spectroscopy.",
keywords = "Frequency Resolved Optical Switching, Phase Retrieval, Ptychography, Pulse Characterization, Silicon, Transient Absorption",
author = "Mayank Kumar and Saadat Mokhtari and Tristan Guay and Adrien Leblanc and Kosta Oubrerie and Jalil, \{Sohail A.\} and Elissa Haddad and Ga{\"e}tan Jargot and Philippe Lassonde and Heide Ibrahim and Giulio Vampa and Fran{\c c}ois L{\'e}gar{\'e}",
note = "Publisher Copyright: {\textcopyright} 2025 SPIE.; Nonlinear Frequency Generation and Conversion: Materials and Devices XXIV 2025 ; Conference date: 28-01-2025 Through 31-01-2025",
year = "2025",
month = jan,
day = "1",
doi = "10.1117/12.3044917",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Jeffrey Moses",
booktitle = "Nonlinear Frequency Generation and Conversion",
}