Abstract
We have analysed by cross-section transmission electron microscopy (XTEM) La0.67Sr0.33MnO3/SrTiO3/La 0.67Sr0.33MnO3 tunnel junctions epitaxially grown on (001) SrTiO3 by pulsed laser deposition (PLD). La0.67Sr0.33MnO3 (LSMO) is rhombohedral in bulk (pseudo-cubic with an angle of 89.76°); its epitaxy on SrTiO3 raises two kinds of questions: (1) are the interfaces chemically abrupt? And (2) is the LSMO strained to a tetragonal phase that would fit the cubic substrate? In the present paper, we show, using high-resolution TEM (HRTEM) micrographs and a semi-quantitative technique based on Chemical Mapping (A. Ourmazd et al., Ultramicroscopy 34 (1990) 237) that the extent of roughness or interdiffusion at the interfaces is less than a single unit cell. On the other hand, we deduce from electron diffraction that the LSMO films are at least partially relaxed.
| Original language | English |
|---|---|
| Pages (from-to) | 91-96 |
| Number of pages | 6 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 211 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 1 Jan 2000 |
| Externally published | Yes |
| Event | E-MRS Spring Meeting 1999 - Symposium G: Material Physics Issues and Applications of Magnetic Oxides - Strasbourg, France Duration: 1 Jun 1999 → 4 Jun 1999 |
Keywords
- Pulsed laser deposition
- Thin films
- Transmission electron microscopy