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Triroc, a versatile 64-channel SiPM readout ASIC for time-of-flight PET

  • Salleh Ahmad
  • , Christophe De La Taille
  • , Julien Fleury
  • , Nathalie Seguin-Moreau
  • , Ludovic Raux
  • , Stephane Callier
  • , Gisele Martin-Chassard
  • , Frederic Dulucq
  • , Damien Thienpont
  • Weeroc
  • Omega (Centre de Microélectronique)-École Polytechnique

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

13 Citations (Scopus)

Abstract

Triroc is a highly configurable SiPM readout ASIC intended for PET prototyping with time-of-flight capability. This 64-channel ASIC incorporates a dual triggering system that will flag the arrival photons and provides energy cut-off at a specified level. Time and charge measurements are performed internally by 40ps-bin TDC and 10-bit ADC. The analog design of this ASIC has been optimized for accepting positive and negative polarity inputs while maintaining nearly similar performances for both input polarities. Channelby-channel input DC level adjustment is also available in order to correct the non-uniformity of SiPM array and fine tuning each pixel gain. Additionally, the digital conversions are assignable to other analog components, which extends the suitability of Triroc for any application requiring SiPM readout. The design of Triroc and the characterization results will be presented in this work.

Original languageEnglish
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
Publication statusPublished - 16 Oct 2017
Externally publishedYes
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: 29 Oct 2016 → 6 Nov 2016

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Conference

Conference2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Country/TerritoryFrance
CityStrasbourg
Period29/10/16 → 6/11/16

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