Abstract
We propose a new technique, using femtosecond Fourier-transform spectral interferometry, to measure the second-order nonlinear response of a material in two dimensions of frequency. We show numerically the specific and unique information obtained from such a two-dimensional measurement. The technique is demonstrated by measuring the second-order phase-matching map of two non-resonant nonlinear crystals.
| Original language | English |
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| Pages (from-to) | 465-476 |
| Number of pages | 12 |
| Journal | Journal of Nonlinear Optical Physics and Materials |
| Volume | 5 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Jan 1996 |