Ultrafast electron relaxation measurements on α-SiO2 using high-order harmonics generation

H. Merdji; S. Guizard; P. Martin; G. Petite; F. Quéré; B. Carré; J. F. Hergott; L. Le Déroff; P. Salières; O. Gobert; P. Meynadier; M. Perdrix

doi:10.1017/S0263034600183193

Ultrafast electron relaxation measurements on α-SiO₂ using high-order harmonics generation

H. Merdji
, S. Guizard
, P. Martin
, G. Petite
, F. Quéré
, B. Carré
, J. F. Hergott
, L. Le Déroff
, P. Salières
, O. Gobert
, P. Meynadier
, M. Perdrix

Research output: Contribution to journal › Article › peer-review

Abstract

Time-resolved photoemission spectroscopy, using high order harmonics, is used to measure the energy relaxation rate of hot electrons in α-SiO₂ with sub-picosecond time resolution. Our results indicate that electrons of 30 eV kinetic energy in the conduction band relax at a rate which is at least two orders of magnitude lower than the one of photo-excited carriers of a few eV. As a result, we give insight in the relaxation process of hot electrons and show that impact ionization probability per unit time is only of the order of 1/40 ps^-1, in very strong contrast with the much higher value generally assumed in models of optical breakdown.

Original language	English
Pages (from-to)	489-494
Number of pages	6
Journal	Laser and Particle Beams
Volume	18
Issue number	3
DOIs	https://doi.org/10.1017/S0263034600183193
Publication status	Published - 1 Dec 2000
Externally published	Yes

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title = "Ultrafast electron relaxation measurements on α-SiO2 using high-order harmonics generation",

abstract = "Time-resolved photoemission spectroscopy, using high order harmonics, is used to measure the energy relaxation rate of hot electrons in α-SiO2 with sub-picosecond time resolution. Our results indicate that electrons of 30 eV kinetic energy in the conduction band relax at a rate which is at least two orders of magnitude lower than the one of photo-excited carriers of a few eV. As a result, we give insight in the relaxation process of hot electrons and show that impact ionization probability per unit time is only of the order of 1/40 ps-1, in very strong contrast with the much higher value generally assumed in models of optical breakdown.",

author = "H. Merdji and S. Guizard and P. Martin and G. Petite and F. Qu{\'e}r{\'e} and B. Carr{\'e} and Hergott, \{J. F.\} and \{Le D{\'e}roff\}, L. and P. Sali{\`e}res and O. Gobert and P. Meynadier and M. Perdrix",

year = "2000",

month = dec,

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doi = "10.1017/S0263034600183193",

language = "English",

volume = "18",

pages = "489--494",

journal = "Laser and Particle Beams",

issn = "0263-0346",

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TY - JOUR

T1 - Ultrafast electron relaxation measurements on α-SiO2 using high-order harmonics generation

AU - Merdji, H.

AU - Guizard, S.

AU - Martin, P.

AU - Petite, G.

AU - Quéré, F.

AU - Carré, B.

AU - Hergott, J. F.

AU - Le Déroff, L.

AU - Salières, P.

AU - Gobert, O.

AU - Meynadier, P.

AU - Perdrix, M.

PY - 2000/12/1

Y1 - 2000/12/1

N2 - Time-resolved photoemission spectroscopy, using high order harmonics, is used to measure the energy relaxation rate of hot electrons in α-SiO2 with sub-picosecond time resolution. Our results indicate that electrons of 30 eV kinetic energy in the conduction band relax at a rate which is at least two orders of magnitude lower than the one of photo-excited carriers of a few eV. As a result, we give insight in the relaxation process of hot electrons and show that impact ionization probability per unit time is only of the order of 1/40 ps-1, in very strong contrast with the much higher value generally assumed in models of optical breakdown.

AB - Time-resolved photoemission spectroscopy, using high order harmonics, is used to measure the energy relaxation rate of hot electrons in α-SiO2 with sub-picosecond time resolution. Our results indicate that electrons of 30 eV kinetic energy in the conduction band relax at a rate which is at least two orders of magnitude lower than the one of photo-excited carriers of a few eV. As a result, we give insight in the relaxation process of hot electrons and show that impact ionization probability per unit time is only of the order of 1/40 ps-1, in very strong contrast with the much higher value generally assumed in models of optical breakdown.

U2 - 10.1017/S0263034600183193

DO - 10.1017/S0263034600183193

M3 - Article

AN - SCOPUS:0034443802

SN - 0263-0346

VL - 18

SP - 489

EP - 494

JO - Laser and Particle Beams

JF - Laser and Particle Beams

IS - 3

ER -

Ultrafast electron relaxation measurements on α-SiO2 using high-order harmonics generation

Abstract

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Ultrafast electron relaxation measurements on α-SiO₂ using high-order harmonics generation