Abstract
X-ray absorption at the SmM4,5 edges and photoemission spectroscopies allow to probe with very high sensitivity the valence changes in Sm overlayers on Si(111)7 x 7.
| Original language | English |
|---|---|
| Pages (from-to) | 729-734 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 65-66 |
| Issue number | C |
| DOIs | |
| Publication status | Published - 2 Mar 1993 |
| Externally published | Yes |