Valency changeover at the Sm/Si(111)7x7 interface through chemisorption and epitaxy

O. Sakho, M. De Santis, M. Sacchi, F. Sirotti, G. Rossi

Research output: Contribution to journalArticlepeer-review

Abstract

X-ray absorption at the SmM4,5 edges and photoemission spectroscopies allow to probe with very high sensitivity the valence changes in Sm overlayers on Si(111)7 x 7.

Original languageEnglish
Pages (from-to)729-734
Number of pages6
JournalApplied Surface Science
Volume65-66
Issue numberC
DOIs
Publication statusPublished - 2 Mar 1993
Externally publishedYes

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