Abstract
The valency changeover in Sm overlayers on Si(111)7×7 is probed with high accuracy using x-ray-absorption spectroscopy at the Sm M4,5 edges. The valency of Sm has been studied as a function of the layer thickness in the chemisorption regime, and compared with the results obtained for epitaxially grown samarium silicide layers.
| Original language | English |
|---|---|
| Pages (from-to) | 3797-3801 |
| Number of pages | 5 |
| Journal | Physical Review B |
| Volume | 47 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1 Jan 1993 |
| Externally published | Yes |
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