TY - JOUR
T1 - X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry
AU - Valdivia, M. P.
AU - Veloso, F.
AU - Stutman, D.
AU - Stoeckl, C.
AU - Mileham, C.
AU - Begishev, I. A.
AU - Theobald, W.
AU - Vescovi, M.
AU - Useche, W.
AU - Regan, S. P.
AU - Albertazzi, B.
AU - Rigon, G.
AU - Mabey, P.
AU - Michel, T.
AU - Pikuz, S. A.
AU - Koenig, M.
AU - Casner, A.
N1 - Publisher Copyright:
© 2018 Author(s).
PY - 2018/10/1
Y1 - 2018/10/1
N2 - Talbot-Lau x-ray interferometers can map electron density gradients in High Energy Density (HED) samples. In the deflectometer configuration, it can provide refraction, attenuation, elemental composition, and scatter information from a single image. X-ray backlighters in Talbot-Lau deflectometry must meet specific requirements regarding source size and x-ray spectra, amongst others, to accurately diagnose a wide range of HED experiments. 8 keV sources produced in the high-power laser and pulsed power environment were evaluated as x-ray backlighters for Talbot-Lau x-ray deflectometry. In high-power laser experiments, K-shell emission was produced by irradiating copper targets (500 × 500 × 12.5 μm3 foils, 20 μm diameter wire, and >10 μm diameter spheres) with 30 J, 8-30 ps laser pulses and a 25 μm copper wire with a 60 J, 10 ps laser pulse. In the pulsed power environment, single (2 × 40 μm) and double (4 × 25 μm) copper x-pinches were driven at ∼1 kA/ns. Moiré fringe formation was demonstrated for all x-ray sources explored, and detector performance was evaluated for x-ray films, x-ray CCDs, and imaging plates in context of spatial resolution, x-ray emission, and fringe contrast.
AB - Talbot-Lau x-ray interferometers can map electron density gradients in High Energy Density (HED) samples. In the deflectometer configuration, it can provide refraction, attenuation, elemental composition, and scatter information from a single image. X-ray backlighters in Talbot-Lau deflectometry must meet specific requirements regarding source size and x-ray spectra, amongst others, to accurately diagnose a wide range of HED experiments. 8 keV sources produced in the high-power laser and pulsed power environment were evaluated as x-ray backlighters for Talbot-Lau x-ray deflectometry. In high-power laser experiments, K-shell emission was produced by irradiating copper targets (500 × 500 × 12.5 μm3 foils, 20 μm diameter wire, and >10 μm diameter spheres) with 30 J, 8-30 ps laser pulses and a 25 μm copper wire with a 60 J, 10 ps laser pulse. In the pulsed power environment, single (2 × 40 μm) and double (4 × 25 μm) copper x-pinches were driven at ∼1 kA/ns. Moiré fringe formation was demonstrated for all x-ray sources explored, and detector performance was evaluated for x-ray films, x-ray CCDs, and imaging plates in context of spatial resolution, x-ray emission, and fringe contrast.
U2 - 10.1063/1.5039342
DO - 10.1063/1.5039342
M3 - Review article
C2 - 30399908
AN - SCOPUS:85055767086
SN - 0034-6748
VL - 89
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 10
M1 - 10G127
ER -