X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility

Charles Reverdin; Frédéric Thais; Guillaume Loisel; M. Busquet; S. Bastiani-Ceccotti; T. Blenski; T. Caillaud; J. E. Ducret; W. Foelsner; D. Gilles; F. Gilleron; J. C. Pain; M. Poirier; F. Serres; V. Silvert; G. Soullie; S. Turck-Chieze; B. Villette

doi:10.1063/1.4740266

X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility

Charles Reverdin
, Frédéric Thais
, Guillaume Loisel
, M. Busquet
, S. Bastiani-Ceccotti
, T. Blenski
, T. Caillaud
, J. E. Ducret
, W. Foelsner
, D. Gilles
, F. Gilleron
, J. C. Pain
, M. Poirier
, F. Serres
, V. Silvert
, G. Soullie
, S. Turck-Chieze
, B. Villette

Research output: Contribution to journal › Article › peer-review

Abstract

An x-ray grating spectrometer was built in order to measure opacities in the 50 eV to 250 eV spectral range with an average spectral resolution EδE ∼ 50. It has been used at the LULI-2000 laser facility at École Polytechnique (France) to measure the Δn=0, n=3 transitions of several elements with neighboring atomic number: Cr, Fe, Ni, and Cu in the same experimental conditions. Hence a spectrometer with a wide spectral range is required. This spectrometer features one line of sight looking through a heated sample at backlighter emission. It is outfitted with one toroidal condensing mirror and several flat mirrors cutting off higher energy photons. The spectral dispersion is obtained with a flatfield grating. Detection consists of a streak camera sensitive to soft x-ray radiation. Some experimental results showing the performance of this spectrometer are presented.

Original language	English
Article number	10E134
Journal	Review of Scientific Instruments
Volume	83
Issue number	10
DOIs	https://doi.org/10.1063/1.4740266
Publication status	Published - 1 Oct 2012

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Reverdin, C., Thais, F., Loisel, G., Busquet, M., Bastiani-Ceccotti, S., Blenski, T., Caillaud, T., Ducret, J. E., Foelsner, W., Gilles, D., Gilleron, F., Pain, J. C., Poirier, M., Serres, F., Silvert, V., Soullie, G., Turck-Chieze, S., & Villette, B. (2012). X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility. Review of Scientific Instruments, 83(10), Article 10E134. https://doi.org/10.1063/1.4740266

@article{675edcf3810f45229a2e950a88c57bff,

title = "X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility",

abstract = "An x-ray grating spectrometer was built in order to measure opacities in the 50 eV to 250 eV spectral range with an average spectral resolution EδE ∼ 50. It has been used at the LULI-2000 laser facility at {\'E}cole Polytechnique (France) to measure the Δn=0, n=3 transitions of several elements with neighboring atomic number: Cr, Fe, Ni, and Cu in the same experimental conditions. Hence a spectrometer with a wide spectral range is required. This spectrometer features one line of sight looking through a heated sample at backlighter emission. It is outfitted with one toroidal condensing mirror and several flat mirrors cutting off higher energy photons. The spectral dispersion is obtained with a flatfield grating. Detection consists of a streak camera sensitive to soft x-ray radiation. Some experimental results showing the performance of this spectrometer are presented.",

author = "Charles Reverdin and Fr{\'e}d{\'e}ric Thais and Guillaume Loisel and M. Busquet and S. Bastiani-Ceccotti and T. Blenski and T. Caillaud and Ducret, \{J. E.\} and W. Foelsner and D. Gilles and F. Gilleron and Pain, \{J. C.\} and M. Poirier and F. Serres and V. Silvert and G. Soullie and S. Turck-Chieze and B. Villette",

year = "2012",

month = oct,

day = "1",

doi = "10.1063/1.4740266",

language = "English",

volume = "83",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

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Reverdin, C, Thais, F, Loisel, G, Busquet, M, Bastiani-Ceccotti, S, Blenski, T, Caillaud, T, Ducret, JE, Foelsner, W, Gilles, D, Gilleron, F, Pain, JC, Poirier, M, Serres, F, Silvert, V, Soullie, G, Turck-Chieze, S & Villette, B 2012, 'X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility', Review of Scientific Instruments, vol. 83, no. 10, 10E134. https://doi.org/10.1063/1.4740266

TY - JOUR

T1 - X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility

AU - Reverdin, Charles

AU - Thais, Frédéric

AU - Loisel, Guillaume

AU - Busquet, M.

AU - Bastiani-Ceccotti, S.

AU - Blenski, T.

AU - Caillaud, T.

AU - Ducret, J. E.

AU - Foelsner, W.

AU - Gilles, D.

AU - Gilleron, F.

AU - Pain, J. C.

AU - Poirier, M.

AU - Serres, F.

AU - Silvert, V.

AU - Soullie, G.

AU - Turck-Chieze, S.

AU - Villette, B.

PY - 2012/10/1

Y1 - 2012/10/1

N2 - An x-ray grating spectrometer was built in order to measure opacities in the 50 eV to 250 eV spectral range with an average spectral resolution EδE ∼ 50. It has been used at the LULI-2000 laser facility at École Polytechnique (France) to measure the Δn=0, n=3 transitions of several elements with neighboring atomic number: Cr, Fe, Ni, and Cu in the same experimental conditions. Hence a spectrometer with a wide spectral range is required. This spectrometer features one line of sight looking through a heated sample at backlighter emission. It is outfitted with one toroidal condensing mirror and several flat mirrors cutting off higher energy photons. The spectral dispersion is obtained with a flatfield grating. Detection consists of a streak camera sensitive to soft x-ray radiation. Some experimental results showing the performance of this spectrometer are presented.

AB - An x-ray grating spectrometer was built in order to measure opacities in the 50 eV to 250 eV spectral range with an average spectral resolution EδE ∼ 50. It has been used at the LULI-2000 laser facility at École Polytechnique (France) to measure the Δn=0, n=3 transitions of several elements with neighboring atomic number: Cr, Fe, Ni, and Cu in the same experimental conditions. Hence a spectrometer with a wide spectral range is required. This spectrometer features one line of sight looking through a heated sample at backlighter emission. It is outfitted with one toroidal condensing mirror and several flat mirrors cutting off higher energy photons. The spectral dispersion is obtained with a flatfield grating. Detection consists of a streak camera sensitive to soft x-ray radiation. Some experimental results showing the performance of this spectrometer are presented.

U2 - 10.1063/1.4740266

DO - 10.1063/1.4740266

M3 - Article

AN - SCOPUS:84868346048

SN - 0034-6748

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 10

M1 - 10E134

ER -

X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility

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