Abstract
We present the first space-resolved experimental determination of electronic density and temperature profiles in the transport region for plane target irradiation with 400600-ps pulses at 0.53- and 0.26-m wavelengths, and (13)×1014-W/cm2 laser intensity. The experimental technique is x-ray spot spectroscopy on thin Al microdots deposited on a carbon substrate. A knife-edge imaging technique ensures a spatial resolution of 3 m along the laser axis. The electronic density and temperature are deduced from Stark broadening and intensity ratios of Al11+ and Al12+ n=4 resonance lines, respectively. The experimental profiles are well reproduced by one-dimensional spherical simulations including nonlocalized thermal flux inhibition or very low inhibition.
| Original language | English |
|---|---|
| Pages (from-to) | 324-331 |
| Number of pages | 8 |
| Journal | Physical Review A - Atomic, Molecular, and Optical Physics |
| Volume | 32 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 1985 |
| Externally published | Yes |
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