XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017 W/cm2

F. B. Rosmej; E. Galtier; D. Riley; T. Dzelzainis; P. Heinmann; F. Y. Khattak; R. W. Lee; B. Nagler; A. Nelson; T. Tschentscher; S. M. Vinko; T. Whitcher; S. Toleikis; R. Fäustlin; R. Soberierski; L. Juha; M. Fajardo; J. S. Wark; J. Chalupsky; V. Hajkova; J. Krzywinski; M. Jurek; M. Kozlova

doi:10.1088/1742-6596/244/4/042028

XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 10¹⁷ W/cm²

F. B. Rosmej
, E. Galtier
, D. Riley
, T. Dzelzainis
, P. Heinmann
, F. Y. Khattak
, R. W. Lee
, B. Nagler
, A. Nelson
, T. Tschentscher
, S. M. Vinko
, T. Whitcher
, S. Toleikis
, R. Fäustlin
, R. Soberierski
, L. Juha
, M. Fajardo
, J. S. Wark
, J. Chalupsky
, V. Hajkova

J. Krzywinski, M. Jurek, M. Kozlova

École Polytechnique

Sorbonne Université
School of Mathematics and Physics
Queen's University of Belfast
Lawrence Livermore National Laboratory
Department of Physics
Kohat University
University of Oxford
c/o DESY
Institute of Physics of the Polish Academy of Sciences
Institute of Physics of the Czech Academy of Sciences
Instituto Superior Técnico
Stanford Linear Accelerator Center

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Aluminium targets were irradiated with 92 eV radiation from FLASH Free Electron Laser at DESY at intensities up to 10¹⁷ W/cm² by focussing the beam on target down to a spot size of ∼1 μm by means of a parabolic mirror. High resolution XUV spectroscopy was used to identify aluminium emission from complex hole-states. Simulations carried out with the MARIA code show that the emission characterizes the electron heating in the transition phase solid-atomic. The analysis allows constructing a simple model of electron heating via Auger electrons.

Original language	English
Article number	042028
Journal	Journal of Physics: Conference Series
Volume	244
Issue number	PART 4
DOIs	https://doi.org/10.1088/1742-6596/244/4/042028
Publication status	Published - 1 Jan 2010

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Rosmej, F. B., Galtier, E., Riley, D., Dzelzainis, T., Heinmann, P., Khattak, F. Y., Lee, R. W., Nagler, B., Nelson, A., Tschentscher, T., Vinko, S. M., Whitcher, T., Toleikis, S., Fäustlin, R., Soberierski, R., Juha, L., Fajardo, M., Wark, J. S., Chalupsky, J., ... Kozlova, M. (2010). XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 10¹⁷ W/cm². Journal of Physics: Conference Series, 244(PART 4), Article 042028. https://doi.org/10.1088/1742-6596/244/4/042028

@article{7411474136f54b139cb275e8ae353ced,

title = "XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017 W/cm2",

abstract = "Aluminium targets were irradiated with 92 eV radiation from FLASH Free Electron Laser at DESY at intensities up to 1017 W/cm2 by focussing the beam on target down to a spot size of ∼1 μm by means of a parabolic mirror. High resolution XUV spectroscopy was used to identify aluminium emission from complex hole-states. Simulations carried out with the MARIA code show that the emission characterizes the electron heating in the transition phase solid-atomic. The analysis allows constructing a simple model of electron heating via Auger electrons.",

author = "Rosmej, \{F. B.\} and E. Galtier and D. Riley and T. Dzelzainis and P. Heinmann and Khattak, \{F. Y.\} and Lee, \{R. W.\} and B. Nagler and A. Nelson and T. Tschentscher and Vinko, \{S. M.\} and T. Whitcher and S. Toleikis and R. F{\"a}ustlin and R. Soberierski and L. Juha and M. Fajardo and Wark, \{J. S.\} and J. Chalupsky and V. Hajkova and J. Krzywinski and M. Jurek and M. Kozlova",

year = "2010",

month = jan,

day = "1",

doi = "10.1088/1742-6596/244/4/042028",

language = "English",

volume = "244",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

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Rosmej, FB, Galtier, E, Riley, D, Dzelzainis, T, Heinmann, P, Khattak, FY, Lee, RW, Nagler, B, Nelson, A, Tschentscher, T, Vinko, SM, Whitcher, T, Toleikis, S, Fäustlin, R, Soberierski, R, Juha, L, Fajardo, M, Wark, JS, Chalupsky, J, Hajkova, V, Krzywinski, J, Jurek, M & Kozlova, M 2010, 'XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 10¹⁷ W/cm²', Journal of Physics: Conference Series, vol. 244, no. PART 4, 042028. https://doi.org/10.1088/1742-6596/244/4/042028

TY - JOUR

T1 - XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017 W/cm2

AU - Rosmej, F. B.

AU - Galtier, E.

AU - Riley, D.

AU - Dzelzainis, T.

AU - Heinmann, P.

AU - Khattak, F. Y.

AU - Lee, R. W.

AU - Nagler, B.

AU - Nelson, A.

AU - Tschentscher, T.

AU - Vinko, S. M.

AU - Whitcher, T.

AU - Toleikis, S.

AU - Fäustlin, R.

AU - Soberierski, R.

AU - Juha, L.

AU - Fajardo, M.

AU - Wark, J. S.

AU - Chalupsky, J.

AU - Hajkova, V.

AU - Krzywinski, J.

AU - Jurek, M.

AU - Kozlova, M.

PY - 2010/1/1

Y1 - 2010/1/1

N2 - Aluminium targets were irradiated with 92 eV radiation from FLASH Free Electron Laser at DESY at intensities up to 1017 W/cm2 by focussing the beam on target down to a spot size of ∼1 μm by means of a parabolic mirror. High resolution XUV spectroscopy was used to identify aluminium emission from complex hole-states. Simulations carried out with the MARIA code show that the emission characterizes the electron heating in the transition phase solid-atomic. The analysis allows constructing a simple model of electron heating via Auger electrons.

AB - Aluminium targets were irradiated with 92 eV radiation from FLASH Free Electron Laser at DESY at intensities up to 1017 W/cm2 by focussing the beam on target down to a spot size of ∼1 μm by means of a parabolic mirror. High resolution XUV spectroscopy was used to identify aluminium emission from complex hole-states. Simulations carried out with the MARIA code show that the emission characterizes the electron heating in the transition phase solid-atomic. The analysis allows constructing a simple model of electron heating via Auger electrons.

UR - https://www.scopus.com/pages/publications/78651281344

U2 - 10.1088/1742-6596/244/4/042028

DO - 10.1088/1742-6596/244/4/042028

M3 - Article

AN - SCOPUS:78651281344

SN - 1742-6588

VL - 244

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - PART 4

M1 - 042028

ER -

XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 10¹⁷ W/cm²

Abstract

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