@inproceedings{14820deabc814dd987b16895095f9496,
title = "A simple impedance correction for on-wafer TAN calibration techniques",
abstract = "A general method initially developed for the estimation of the S-parameters measurement errors caused by non-ideal calibration standards, is applied for the correction of the reference impedance of 7-term through-attenuator-network (TAN) calibration procedures such as thru-attenuator reflect (TAR). Deviations from ideal calibration elements are measured on-wafer using the multiline TRL method and can be taken into account without the need for a precise determination of the reference impedance (lumped elements).",
author = "M. Bahouche and D. Allal and E. Bergeault",
year = "2008",
month = sep,
day = "23",
doi = "10.1109/CPEM.2008.4574831",
language = "English",
isbn = "9781424424009",
series = "CPEM Digest (Conference on Precision Electromagnetic Measurements)",
pages = "418--419",
booktitle = "2008 Conference on Precision Electromagnetic Measurements Digest, CPEM 2008",
note = "2008 Conference on Precision Electromagnetic Measurements Digest, CPEM 2008 ; Conference date: 08-06-2008 Through 13-06-2008",
}