TY - GEN
T1 - A study of statistical variability-aware methods
AU - Cai, Hao
AU - Liu, Kaikai
AU - De Barros Naviner, Lirida Alves
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/10/21
Y1 - 2014/10/21
N2 - Conventionally circuit performance variability is analyzed with Monte-Carlo simulation and design corner analysis. On the other hand, statistical methods such as design of experiments (DoEs), response surface modeling (RSM) and compact modeling (CM) can achieve a better trade-off between simulation efficiency and accuracy. This paper investigates these variability-aware analysis methodologies. Based on industry standard BSIM4 compact model, selected physical parameters are applied to DoE-RSM and CM methods. Methodologies are validated with both analog (op-amp) and digital circuits (flip-flop) at 65 nm node. A 3X speed up is achieved with DoE-RSM. A proper selection of CM parameters is critical to model accuracy.
AB - Conventionally circuit performance variability is analyzed with Monte-Carlo simulation and design corner analysis. On the other hand, statistical methods such as design of experiments (DoEs), response surface modeling (RSM) and compact modeling (CM) can achieve a better trade-off between simulation efficiency and accuracy. This paper investigates these variability-aware analysis methodologies. Based on industry standard BSIM4 compact model, selected physical parameters are applied to DoE-RSM and CM methods. Methodologies are validated with both analog (op-amp) and digital circuits (flip-flop) at 65 nm node. A 3X speed up is achieved with DoE-RSM. A proper selection of CM parameters is critical to model accuracy.
U2 - 10.1109/RFIT.2014.6933246
DO - 10.1109/RFIT.2014.6933246
M3 - Conference contribution
AN - SCOPUS:84912035467
T3 - RFIT 2014 - 2014 IEEE International Symposium on Radio-Frequency Integration Technology: Silicon Technology Heats Up for THz
BT - RFIT 2014 - 2014 IEEE International Symposium on Radio-Frequency Integration Technology
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2014
Y2 - 27 August 2014 through 30 August 2014
ER -