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Analysis of the X-ray and time-resolved XUV emission of laser produced Xe and Kr plasmas

  • CEA/UVSQ/CNRS
  • National Institute of Advanced Industrial Science and Technology
  • CELIA, Université Bordeaux i, UMR 5107 (CNRS, Bordeaux 1, CEA)

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

A frequency-doubled laser beam of the Nd:glass kilojoule nanosecond LULI2000 facility (1.5 ns duration, 200-400 J energy, 0.53 μm wavelength) was focused on a Xe or Kr gas jet. The plasma was simultaneously diagnosed with X-ray (in the wavelength range of 6-8 Å for Kr and of 12-15 Å for Xe) and time-resolved XUV (20-200 Å) emission spectroscopy. Electron density and temperature as well as the ionization charge were measured by time-resolved Thomson scattering of the heating laser pulse. The spectra are compared with the calculations performed with the NLTE collisional-radiative code AVERROES/TRANSPEC. Best fits of the X-ray and XUV spectra obtained are presented. The measured charge distribution and dynamics is analyzed using the simultaneous Thomson scattering diagnostic.

langue originaleAnglais
Pages (de - à)20-27
Nombre de pages8
journalHigh Energy Density Physics
Volume3
Numéro de publication1-2
Les DOIs
étatPublié - 1 mai 2007

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