Analytical methods for AMC and EBG characterizations

M. Grelier; F. Linot; A. C. Lepage; X. Begaud; J. M. Lemener; M. Soiron

doi:10.1007/s00339-011-6255-x

Analytical methods for AMC and EBG characterizations

M. Grelier
, F. Linot
, A. C. Lepage
, X. Begaud
, J. M. Lemener
, M. Soiron

CNRS LTCI
Thales Group

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

Résumé

AMC and EBG behaviors are respectively characterized by reflection phase method and dispersion diagram. A fast and simple analytical model based on transmission line theory is proposed for each analysis. The validity of these analytical methods is verified by a comparison between circuit representations, measurements and numerical results.

langue originale	Anglais
Pages (de - à)	805-808
Nombre de pages	4
journal	Applied Physics A: Materials Science and Processing
Volume	103
Numéro de publication	3
Les DOIs	https://doi.org/10.1007/s00339-011-6255-x
état	Publié - 1 janv. 2011
Modification externe	Oui

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10.1007/s00339-011-6255-x

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title = "Analytical methods for AMC and EBG characterizations",

abstract = "AMC and EBG behaviors are respectively characterized by reflection phase method and dispersion diagram. A fast and simple analytical model based on transmission line theory is proposed for each analysis. The validity of these analytical methods is verified by a comparison between circuit representations, measurements and numerical results.",

author = "M. Grelier and F. Linot and Lepage, \{A. C.\} and X. Begaud and Lemener, \{J. M.\} and M. Soiron",

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AU - Lemener, J. M.

AU - Soiron, M.

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M3 - Article

AN - SCOPUS:79959338642

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Analytical methods for AMC and EBG characterizations

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