Analytical methods to assess transient faults effects in logic circuits

Lirida Alves De Barros Naviner

doi:10.1109/MWSCAS.2014.6908503

Analytical methods to assess transient faults effects in logic circuits

Lirida Alves De Barros Naviner

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

Résumé

This work addresses transient faults in deep submicron technologies. We focus on reliability assessment approaches highlighting those based on analytical models. The paper includes a description of solutions reported in the literature and discusses their suitability from a reliability improvement perspective.

langue originale	Anglais
titre	2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014
Editeur	Institute of Electrical and Electronics Engineers Inc.
Pages	667-670
Nombre de pages	4
ISBN (Electronique)	9781479941346, 9781479941346
Les DOIs	https://doi.org/10.1109/MWSCAS.2014.6908503
état	Publié - 23 sept. 2014
Evénement	2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014 - College Station, États-Unis Durée: 3 août 2014 → 6 août 2014

Série de publications

Nom	Midwest Symposium on Circuits and Systems
ISSN (imprimé)	1548-3746

Une conférence

Une conférence	2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014
Pays/Territoire	États-Unis
La ville	College Station
période	3/08/14 → 6/08/14

Accès au document

10.1109/MWSCAS.2014.6908503

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Contient cette citation

Alves De Barros Naviner, L. (2014). Analytical methods to assess transient faults effects in logic circuits. Dans 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014 (p. 667-670). Article 6908503 (Midwest Symposium on Circuits and Systems). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSCAS.2014.6908503

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author = "\{Alves De Barros Naviner\}, Lirida",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014 ; Conference date: 03-08-2014 Through 06-08-2014",

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doi = "10.1109/MWSCAS.2014.6908503",

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Alves De Barros Naviner, L 2014, Analytical methods to assess transient faults effects in logic circuits. Dans 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014., 6908503, Midwest Symposium on Circuits and Systems, Institute of Electrical and Electronics Engineers Inc., p. 667-670, 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, États-Unis, 3/08/14. https://doi.org/10.1109/MWSCAS.2014.6908503

Analytical methods to assess transient faults effects in logic circuits. / Alves De Barros Naviner, Lirida.
2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 667-670 6908503 (Midwest Symposium on Circuits and Systems).

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

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PY - 2014/9/23

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T3 - Midwest Symposium on Circuits and Systems

SP - 667

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BT - 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014

Y2 - 3 August 2014 through 6 August 2014

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Analytical methods to assess transient faults effects in logic circuits

Résumé

Série de publications

Une conférence

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