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Applications of intense ultra-short XUV pulses to solid state physics: Time-resolved luminescence spectroscopy and radiation damage studies

  • M. De Grazia
  • , H. Merdji
  • , B. Carré
  • , J. Gaudin
  • , G. Geoffroy
  • , S. Guizard
  • , N. Fedorov
  • , A. Belsky
  • , P. Martin
  • , M. Kirm
  • , V. Babin
  • , E. Feldbach
  • , S. Vielhauer
  • , V. Nagirnyi
  • , A. Vassil'Ev
  • , F. Krejci
  • , J. Kuba
  • , J. Chalupsky
  • , J. Cihelka
  • , V. Hajkova
  • M. Ledinský, L. Juha
  • Institut Pierre Simon Laplace, CNRS and CEA
  • Laboratoire des Solides Irradiés
  • CEA/UVSQ/CNRS
  • Institute of Physics
  • University Tartu
  • Physics Faculty
  • Moscow State University
  • Czech Technical University in Prague
  • Center for Particle Physics
  • Institute of Physics of the Czech Academy of Sciences

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

4 Citations (Scopus)

Résumé

The new XUV sources, which deliver spatially coherent pulses of high peak power, allow to study elementary processes in the light/solid interaction in the high intensity regime (> 1011 W/cm2). Here, we report two studies which have used high-order laser harmonics (HH) generated in gas as the excitation source. Firstly, we have investigated the dynamics of electron relaxation in the wide gap CdWO4 dielectric crystal, an efficient scintillator material, using time-resolved luminescence spectroscopy. The kinetics decay of luminescence shows evidence of non radiative relaxation of the self-trapped excitons at the μs damage to surfaces of poly(methyl methacrylate) - PMMA, induced by a multi-shot XUV-irradiation (1 kHz reprate) for given fluence, below damage threshold range of ≈ mJ/cm2. The main processes participating in the surface modification, polymer chain scission followed by the blow up of the volatile, molecular fragments and cross-linking in the near-surface layer of remaining material, are tentatively identified and associated to, crater formation for short-time exposure (< 1 min) and surface hardening for long-time exposure (≥ 1 min).

langue originaleAnglais
titreDamage to VUV, EUV, and X-ray Optics
Les DOIs
étatPublié - 19 nov. 2007
Modification externeOui
EvénementDamage to VUV, EUV, and X-ray Optics - Prague, République tchcque
Durée: 18 avr. 2007 → 19 avr. 2007

Série de publications

NomProceedings of SPIE - The International Society for Optical Engineering
Volume6586
ISSN (imprimé)0277-786X

Une conférence

Une conférenceDamage to VUV, EUV, and X-ray Optics
Pays/TerritoireRépublique tchcque
La villePrague
période18/04/07 → 19/04/07

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