TY - GEN
T1 - Automatic selective hardening against soft errors
T2 - 2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012
AU - Pagliarini, Samuel N.
AU - Ben Dhia, Arwa
AU - A. De B. Naviner, Lirida
AU - Naviner, Jean Francois
PY - 2012/12/1
Y1 - 2012/12/1
N2 - This paper proposes a methodology to automatically apply selective hardening into a circuit based on the net hardening concept. Analysis is performed in the profile of a hardening cost function, in order to automatically determine a stop point for the hardening process. Such analysis can be, sometimes, very time consuming, and even intractable for large circuits. In order to overcome such limitation, two approaches are presented and combined in this paper. The first one takes advantage of circuit regularity, while the second limits the scope of the analysis. A set of circuits from the ISCAS85 benchmarks is used as case study. Simulation results demonstrate the effectiveness of the proposed methodology, where substantial reductions of the required computation time are achieved.
AB - This paper proposes a methodology to automatically apply selective hardening into a circuit based on the net hardening concept. Analysis is performed in the profile of a hardening cost function, in order to automatically determine a stop point for the hardening process. Such analysis can be, sometimes, very time consuming, and even intractable for large circuits. In order to overcome such limitation, two approaches are presented and combined in this paper. The first one takes advantage of circuit regularity, while the second limits the scope of the analysis. A set of circuits from the ISCAS85 benchmarks is used as case study. Simulation results demonstrate the effectiveness of the proposed methodology, where substantial reductions of the required computation time are achieved.
KW - Automatic selective hardening
KW - fault tolerance
KW - reliability analysis
KW - single event effects
KW - soft errors
U2 - 10.1109/ICECS.2012.6463645
DO - 10.1109/ICECS.2012.6463645
M3 - Conference contribution
AN - SCOPUS:84874600912
SN - 9781467312615
T3 - 2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012
SP - 753
EP - 756
BT - 2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012
Y2 - 9 December 2012 through 12 December 2012
ER -