TY - GEN
T1 - Availability analysis for synchronous data-flow graphs in mixed-criticality systems
AU - Medina, Roberto
AU - Borde, Etienne
AU - Pautet, Laurent
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/7/11
Y1 - 2016/7/11
N2 - The safety-critical industry is compelled to continually increase the number of functionalities in embedded systems. These platforms tend to integrate software with various non-functional requirements, in particular different levels of criticality. As a consequence, Mixed-Criticality Systems emerged in order to assure robustness, safety and predictability for these embedded platforms. Although Mixed-Critcality Systems show promising results, formal methods to quantify availability are still missing for this type of systems and will most likely be required for deployment. This paper presents a transformation process that first produces a formal model of a Mixed-Criticality System. From this formal model, it generates a PRISM automaton in order to compute availability.
AB - The safety-critical industry is compelled to continually increase the number of functionalities in embedded systems. These platforms tend to integrate software with various non-functional requirements, in particular different levels of criticality. As a consequence, Mixed-Criticality Systems emerged in order to assure robustness, safety and predictability for these embedded platforms. Although Mixed-Critcality Systems show promising results, formal methods to quantify availability are still missing for this type of systems and will most likely be required for deployment. This paper presents a transformation process that first produces a formal model of a Mixed-Criticality System. From this formal model, it generates a PRISM automaton in order to compute availability.
U2 - 10.1109/SIES.2016.7509431
DO - 10.1109/SIES.2016.7509431
M3 - Conference contribution
AN - SCOPUS:84982091490
T3 - 2016 11th IEEE International Symposium on Industrial Embedded Systems, SIES 2016 - Proceedings
BT - 2016 11th IEEE International Symposium on Industrial Embedded Systems, SIES 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IEEE International Symposium on Industrial Embedded Systems, SIES 2016
Y2 - 23 May 2016 through 25 May 2016
ER -