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Back to 3D: Few-Shot 3D Keypoint Detection with Back-Projected 2D Features

  • École Polytechnique
  • Technical University of Munich
  • King Abdullah University of Science and Technology

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Résumé

With the immense growth of dataset sizes and computing resources in recent years, so-called foundation models have become popular in NLP and vision tasks. In this work, we propose to explore foundation models for the task of key-point detection on 3D shapes. A unique characteristic of keypoint detection is that it requires semantic and geomet-ric awareness while demanding high localization accuracy. To address this problem, we propose, first, to back-project features from large pre-trained 2D vision models onto 3D shapes and employ them for this task. We show that we ob-tain robust 3D features that contain rich semantic information and analyze multiple candidate features stemming from different 2D foundation models. Second, we employ a key-point candidate optimization module which aims to match the average observed distribution of keypoints on the shape and is guided by the back-projected features. The resulting approach achieves a new state of the art for few-shot key-point detection on the KeyPointNet dataset, almost doubling the performance of the previous best methods.

langue originaleAnglais
titreProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
EditeurIEEE Computer Society
Pages4154-4164
Nombre de pages11
ISBN (Electronique)9798350353006
Les DOIs
étatPublié - 1 janv. 2024
Modification externeOui
Evénement2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Seattle, États-Unis
Durée: 16 juin 202422 juin 2024

Série de publications

NomProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (imprimé)1063-6919

Une conférence

Une conférence2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
Pays/TerritoireÉtats-Unis
La villeSeattle
période16/06/2422/06/24

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