Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia

C. Palavicini; Y. Jaouën; P. Gallion; G. Campuzano

Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia

C. Palavicini
, Y. Jaouën
, P. Gallion
, G. Campuzano

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

Résumé

Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

langue originale	Espagnol
Pages (de - à)	379-386
Nombre de pages	8
journal	Revista Mexicana de Fisica
Volume	52
Numéro de publication	4
état	Publié - 1 janv. 2006

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@article{8f14448463604e049d3aa9a64fa8e208,

title = "Caracterizaci{\'o}n de componentes fot{\'o}nicos utilizando reflectometr{\'i}a {\'o}ptica de baja coherencia",

abstract = "Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.",

keywords = "Optical low-coherence reflectometry, Photonic device characterization",

author = "C. Palavicini and Y. Jaou{\"e}n and P. Gallion and G. Campuzano",

year = "2006",

month = jan,

day = "1",

language = "Spanish",

volume = "52",

pages = "379--386",

journal = "Revista Mexicana de Fisica",

issn = "0035-001X",

number = "4",

}

TY - JOUR

T1 - Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia

AU - Palavicini, C.

AU - Jaouën, Y.

AU - Gallion, P.

AU - Campuzano, G.

PY - 2006/1/1

Y1 - 2006/1/1

N2 - Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

AB - Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

KW - Optical low-coherence reflectometry

KW - Photonic device characterization

UR - https://www.scopus.com/pages/publications/33750030132

M3 - Article

AN - SCOPUS:33750030132

SN - 0035-001X

VL - 52

SP - 379

EP - 386

JO - Revista Mexicana de Fisica

JF - Revista Mexicana de Fisica

IS - 4

ER -